Top Stories

Different Ways To Improve Chip Reliability
Push toward zero defects requires more and different kinds of test in new places.

Test In New Frontiers: Flexible Circuits
How test is keeping up with technology changes.

Leveraging Data In Chipmaking
PDF Solutions’ CEO talks about the growing impact of analytics and AI on semiconductor design and manufacturing.

Blogs

Editor In Chief Ed Sperling argues that how AI/ML systems will age is not well understood, and that’s a big problem, in AI’s Blind Spots.

Mentor’s Matthew Knowles describes erasing the gap between automatic test equipment and DFT debug software to streamline silicon bring-up and debug, in A Breakthrough In Silicon Bring-Up.

National Instruments’ Sarah Yost admits it’s exciting to look ahead to the next big thing but warns a lot is left to do in 5G, in Should We Even Be Talking About 6G?

OptimalPlus’ Peter Hodgins explains why data helps optimize the manufacturing process of electric powertrains to make them higher quality, safer, and less expensive, in Building Powertrains To Meet EV Demand.

YieldHub’s Kevin Robinson advises when to consider using a Software-as-a-Service model, in Software Support Scenarios.