Top Stories

Aftermarket Sensors Boost Yield In Wafer Fabs
More data improves throughput, helps extend the life of equipment.

Silicon Lifecycle Management Gains Steam
Gaps remain, but the broad integration of data from design through manufacturing, test, and assembly holds promise for improving reliability.

Testing For Thermal Issues Becomes More Difficult
Chiplets, exotic materials, and heterogeneous integration are impacting test coverage.

Why Chips Fail, And What To Do About It
Improving reliability in semiconductors is critical for automotive, data centers, and AI systems.

Tech Talk Video

Speeding Up Acoustic Wafer Inspection
Why rotational scanning shrinks inspection time in complex chips and packages.

Sponsor Blogs

Teradyne’s Jeorge Hurtarte explains how growth in data-rich applications is driving change for the automated test equipment sector, in Semiconductor Test Faces Technology Shifts In The AI Era.

Advantest’s Ken Butler contends that small improvements in test coverage can result in significantly larger reductions in test escapes, in Understanding Test Quality In Semiconductor Devices: An Overview.

proteanTecs’ Guy Gozlan shows how machine learning can be applied to wafer sort data and help predict the likelihood a chip will fall into a specific bin during the final test, in Shift Left Strategy For Semiconductor Production Testing.

PDF Solutions’ John Kibarian explores how the latest tools allow for improved predictions of equipment failures, optimized production schedules, and better yield and profitability, in AI Predictive Modeling Tools Move Into Critical Role To Leverage AI, ML.

Bruker Optics’ Antonia Eckert outlines the benefits of simultaneous measurement of multiple gases to identify sources of air pollution, in Gas Analysis For A Greener Tomorrow.

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