Top Stories
Automation And AI Improve Failure Analysis
Better tools, automation, and analytics improve FA, but determining the cause of failure is still difficult.
Cutting IC Manufacturing Costs By Combining Data
Mixing financial data with manufacturing analytics can boost efficiency, but there are still pockets of resistance.
Failure To Launch
Fundamental changes are needed in failure analysis to keep pace with changes in chip technology.
Video
What’s Changing In Outlier Detection
Augmenting testing metrics to improve reliability.
Sponsor Blogs
Onto Innovation’s Jiangtao Hu examines the benefits of integrating DUV spectroscopic ellipsometry with laser ellipsometry for gate oxide metrology, in Measuring Multi-Layer Ultra-Thin Critical Films.
Synopsys’ Faisal Goriawalla explains how integrating the functionality of the HBM base die into a logic die provides greater flexibility and additional control, in Speeding Down Memory Lane With Custom HBM.
Siemens’ Marc Hutner digs into diagnosis-driven yield analysis and how it can uncover previously unknown systematic issues, reducing physical failure analysis cycle time, in Unlocking The Value Of Yield.
Teradyne’s Jeorge Hurtarte finds that co-packaged optics require hybrid testing systems, with reliable alignment techniques that can handle both electrical and optical signals simultaneously, in Silicon Photonics Raises New Test Challenges.
Advantest’s Ira Leventhal explores the diverse class of AI chips and contends that test-flow stages must become dynamically adaptable with real-time decision-making, in AI Semiconductors Require An Integrated Test Solution.
Sponsor White Papers
Reversible Chain Diagnosis
Improve scan chain diagnosis resolution by 4X.
Full-Chip Voltage Contrast Inference Using Deep Learning; You Only Look Once: Voltage Contrast (YOLO-VC)
Deep-learning approach for full-chip voltage contrast inference.
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