Top Stories

Yield Management Embraces Expanding Role
From wafer maps to lifecycle management, yield strategies go wide and deep with big data.

Advanced Packaging Drives Test And Metrology Innovations
Complex devices are pushing test and metrology tools to their limits, but solutions are coming online.

Balancing Parallel Test Productivity With Yield & Cost
Expensive DUT interface boards complicate development and operations.

Sponsor Blogs

Onto Innovation’s Sean King contends that creating a successful digital twin relies on asking the right questions and knowing what problem you’re trying to solve, in Getting The Biggest ROI On Your Digital Twin.

proteanTecs’ Eyal Fayneh explores workload- and reliability-aware adaptive voltage scaling that is safer than traditional methods, enabling fewer guard-bands, in Extending Chip Lifetime With Safer Voltage Scaling.

Synopsys’ Hari Mani explains how to ensure that test patterns do not place the SoC in danger of thermal runaway and damage, in Power-Aware Test Vector Porting For Production ATE.

PDF Solutions’ John Kibarian digs into the best applications for AI/ML, such as identifying anomalies in the vast amounts of data generated by fabs, in AI’s Ability To Deliver Breakthroughs Across Semiconductor Design And Manufacturing.

Bruker’s Inga Koehler warns that counterfeiters are using more advanced blacktopping techniques to evade solvent-based detection methods, in FTIR Detects Counterfeit Electronics.

Teradyne’s Jeorge Hurtarte looks at the benefits of SiC and GaN, and why these compound semiconductors require new testing approaches, in Silicon Carbide And Gallium Nitride Bring New Challenges For Semiconductor Test.

Advantest’s Keith Schaub extols the advantages of integrating data sources across the entire IC manufacturing supply chain, including better yield and quality, in A Renaissance Of Innovation.

Sponsor White Paper

Outsmarting Silent Data Corruption in AI Processors with Two-Stage Detection
ML-powered outlier detection for semiconductor defects and real-time monitoring for in-field predictive and prescriptive maintenance.

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