Special Report
Defect Challenges Grow At The Wafer Edge
Better measurement of edge defects can enable higher yield while preventing catastrophic wafer breakage, but the number of possible defects is increasing.
Top Stories
Promises and Perils of Parallel Test
Test costs may be reduced, but how much depends on a whole bunch of factors.
Standardizing Fault Coverage In Analog/Mixed Signal Test
IEEE P2427 is poised to be the cornerstone in the testing and validation of AMS designs; full industry support is still developing.
Tech Talk Video
Real-Time Safety Monitoring
How do you know when a safety-critical chip is working properly?
Blogs
Onto Innovation’s Prasad Bachiraju details how to detect dormant defects, use feedback and feedforward measures, and monitor the health of process control equipment, in Achieving Zero Defect Manufacturing Part 3: Prevention Of Defects.
Synopsys’ Nozar Nozarian explains why hyperscalers are turning to a new approach to deliver structural/scan test data, in Taking Data Center Serviceability To The Next Level.
Teradyne’s Jeorge Hurtarte shows how flexible test strategies enable companies to thrive in a landscape impacted by legislation, technology development, and a shifting talent pool, in How The Semiconductor Ecosystem Is Responding To Its Global Challenges.
Advantest’s Keith Schaub details the benefits of real-time corrective data analysis and adaptive decision-making support, in From Mobile Phones To Robotics: How The Industry Continues To Drive Innovation.
Sponsor White Papers
Non-Destructive Measurement of Bottom Width in Deep Trench Isolation Structures using IRCD Metrology
Deep Trench Isolation enables device scaling in BCD power management ICs and improves overall performance.
CMP Process Characterization Using White Light Interferometry
Measurement and analysis advantages that white light interferometry (WLI) offers for the various CMP components.
Introduction to the PXI Architecture
Building high-performance, mixed-measurement systems for validation and production test.
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