Special Report
Screening For Silent Data Errors
More SDEs can be found using targeted electrical tests and 100% inspection, but not all of them.
Top Stories
Metrology Options Increase As Device Needs Shift
Optical and e-beam methods are extended, while new techniques find niche uses.
Looking Inside Of Chips
ProteanTecs’ CEO talks about the growth of on-chip monitoring, the need for deep data analytics and predictive maintenance, and the importance of resiliency.
Blogs
Teradyne’s Natalian Z. Der explains why testing products in a manner closely matching the end use improves quality and shortens time to market, in Emerging Technologies Are Driving System Level Test Adoption.
Advantest’s Sonny Banwari and Matthias Sauer look at establishing an ecosystem for data-driven ML test offerings, in Industrial Solutions For Machine-Learning-Enabled Yield Optimization And Test.
Synopsys’ Ash Patel and Karthik Natarajan explain why running the same structural tests at different points in the product lifecycle could catch more failures, in Scan Pattern Portability From PSV To ATE To SLT To IST.
Sponsor White Papers
Reducing Simulation Regression Turnaround Time With Dynamic Performance Optimization
An alternative approach that automates key aspects of optimizing simulation performance and reducing turnaround time.
IR Laser Imaging Is Rapidly Changing IR Microscopy
IR laser imaging is being commercialized into smart analytical equipment, and new applications are emerging.
System Level Test — A Primer: White Paper
System Level Test (SLT) is becoming essential as semiconductor geometries shrink.
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