Semiconductor Engineering TMA

What Causes Semiconductor Aging?
Why this is becoming a bigger issue, and what can be done to mitigate the effects.

Onto Innovation’s Nick Keller lays out how to use the mid-IR wavelength range to measure key parameters in challenging layers, in Critical Moves: Advanced Logic Devices And CIS Benefit From Applications Using IRCD Metrology.

Siemens EDA’s Ron Press looks at new DFT solutions that solve more complex challenges, in Simplify DFT For Advanced SoCs.

Synopsys’ Jamileh Davoudi describes how to reduce subjectivity and errors when performing functional safety analysis, in Is A Guestimate Good Enough For Obtaining Failure Mode Distribution?

Smart DFT Infrastructure And Automation Are Key To Managing Design Scaling
Ensure a high rate of success at each step in the DFT flow by adopting a smarter methodology.

Evolution Of Data Center Networking Technology — IP And Beyond
How Ethernet standards evolved from supporting home networking to now enabling hyperscale and cloud data-center networking.