Top Stories

Fab And Field Data Transforming Manufacturing Processes
Data from on-chip monitors can help predict and prevent failures, as well as improve design, manufacturing, and testing processes.

Customizing IC Test To Improve Yield And Reliability
Identifying chip performance specs earlier can shorten the time it takes for processes to mature and lower overall test costs in manufacturing.

Improving Reliability In Chips
Experts at the Table: Tracing device quality throughout a device’s expected lifetime.

Blogs

Onto Innovation’s Keith Best zeroes in on next-gen IC substrates, in The Glass Substrate Question: When Will It Replace Copper Clad Laminate?

NI’s Kaitlyn Mazzarella looks at the role of power management integrated circuits (PMICs) in efficient power consumption, in The Growing Importance Of PMIC Validation.

Synopsys’ Rohan Bhatnagar explains how PVT monitors can help detect failures buried deep in chips, in Automotive Safety Requires PVT Monitoring IP Within Semiconductor ICs.

Teradyne’s Fisher Zhang details why optimizing the design-manufacture-test loop can reduce defect escape rates and lower test costs, in Test Strategies In The Era Of Heterogeneous Integration.

Advantest’s Yoshiyuki Aoki  and Tsunetaka Akutagawa show how a micro-ammeter-frontend (MMAF) module can connect to the multifunction mixed high voltage (MMXHE) module to enable massively parallel, high-performance testing of power trains, controls, and sensors in electrified vehicles, in MMAF Option Enables Picoampere Measurements.

Sponsor White Papers

Synopsys Timing Constraints Manager: Constraint Verification
A constraint verification solution plays the role of a devil’s advocate when it brings to the attention of engineers sophisticated design/constraints issues that are not flagged by other tools.

ProteanTecs On-Chip Monitoring And Deep Data Analytics System
A solution for reliability, yield, performance, and power co-optimization.

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