Top Stories

Using Smart Data To Boost Semiconductor Reliability
Tools and algorithms are improving faster than a willingness to share data, but at some point economics and talent shortages will force big changes.

Integration Challenges For ATE Data
Collecting data to boost reliability and yield is happening today, but sharing it across multiple tools and vendors is a tough sell.

Streamlining Failure Analysis Of Chips
Identifying nm-sized defects in a substrate, mixing FA with metrology, and the role ML in production.

Data, System Reliability, And Privacy
Sharing data from design to the field can improve reliability, but it raises other questions for which there are no clear answers today.

Blogs

Onto Innovation’s Johnny Dai, Cheolkyu Kim, and Priya Mukundhan look at the most promising power semiconductor devices for future use cases such as electric vehicles, in Optimizing Metal Film Measurement On IGBT And MOSFET Power Devices With Picosecond Ultrasonic Technology.

NI’s Marcus daSilva explains why integrating AI directly into the physical layer can create issues that need to be carefully addressed, in AI Testing AI: The Future Of 6G Test.

Advantest’s Vijayakumar Thangamariappan evaluates three types of object-detection algorithms to improve the inspection process, in Comparison Of State-Of-The-Art Models For Socket Pin Defect Detection.

Synopsys’ Pawini Mahajan digs into the advantages of predictive maintenance in the auto industry, including using advanced monitoring and analytical techniques as a part of silicon lifecycle management, in Importance Of Certifications In Automotive IP.

Teradyne’s Eli Roth shows how integrating data analytics and AI/ML into semiconductor manufacturing processes will help to keep up with the expected pace of the market, in Delivering Real-Time Analytics To Semiconductor Test.

Bruker’s Inga Koehler describes which filters are available and how to select the right one for your needs, in Particle Filter Material Choice For Raman And FTIR Microscopy.

DR Yield’s Dieter Rathei explains why installing a yield management system ahead of the critical yield ramp up phase can pay for itself, in Installing Yield Software Early In A Ramp Up.

Sponsor White Paper

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap For Zero Defects
An overview of normal JEDEC-defined high temperature operating life (HTOL) test procedures and the current limitations, and details for smart selection of test parameters.

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