Top Stories
Enablers And Barriers For Connecting Diverse Data
Integrating multiple types of data is possible in some cases, but it’s still not easy.
More Errors, More Correction In Memories
New technologies increase the cost of accuracy as density increases.
Coping With Parallel Test Site-To-Site Variation
Why this is a growing problem, and how it’s being addressed.
Blogs
Onto’s Benoit Ravot shows how FTIR modeling delivers metrics based on materials’ bond types for compositional process control, in Advanced Modeling In FTIR Offers New Applications For HVM.
Siemens’ Jayant D’Souza lays out an alternative to the standard fault isolation techniques for both low-volume test vehicles and product ramp, in Novel Reversible Chain Diagnosis Improves Resolution.
Advantest’s Philip Brock and Louis Benton, Jr. and Microchip’s Jonvyn Wongso reveal that each module in a keyless entry fob poses specific testing challenges and restrictions, in Automotive Keyless Entry SoC Test Methodologies And Techniques.
Synopsys’ Steve Pateras looks at how silicon lifecycle management is extending into bring-up and in-field operation, in Expanding Silicon Lifecycle Management To Real-Time System Performance Optimization.
Sponsor White Papers
Reversible Chain Diagnosis
Improve scan chain diagnosis resolution by 4X.
Industrial Radiography — CT Scanning For Metrology Applications
Evaluating measurements of a calibrated scan artifact, repeated at intervals throughout the usable work volume of the machine.
Imaging Of Overlay And Alignment Markers Under Opaque Layers Using Picosecond Laser Acoustic Measurements
An alternative method to characterize the overlay and alignment patterns that are embedded under opaque metal films.
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