Top Stories

Embedded Flash Scaling Limits
Extending NOR below 28nm may not happen; automotive impact unclear.

Fabs Meet Machine Learning
D2S’ CEO sounds off on the impact of deep learning, EUV and other manufacturing advancements.

FD-SOI Going Mainstream
Experts at the Table, part 1: What previously was a niche technology has finally found a comfortable market on the fine line between finFETs and established nodes.

Videos

22nm Process Technology
How FD-SOI compares with bulk technologies.

New Roadmap For Electronics
How new packaging and materials are changing the traditional physical boundaries of ICs.

Blogs

Editor In Chief Ed Sperling looks at why the next steps in scaling will break the old rules, in Scaling Sideways.

Executive Editor Mark LaPedus talks with Leti’s CEO about a new Soitec deal and R&D trends, in Leti’s Next Focus.

Applied Materials’ Jonathan Bakke explains why future performance, power, area and cost improvements require materials engineered at the atomic scale, in The Role Of Cobalt In Enabling AI.

GlobalFoundries’ Gary Dagastine contends that decentralized in-car network architectures lack the ability to react in real-time to the vast amount of data required by machine learning, in Moving To ASICs For ADAS.

SEMI’s Scott Stevens finds an upbeat outlook across the industry, in The Era Of Data, By The Numbers.

Sponsor White Paper

Estimating MOSFET Leakage From Low-Cost, Low-Resolution Fast Parametric Test
How to effectively characterize transistor leakage during volume production with minimal test time.