Top Stories

Too Much Fab And Test Data, Low Utilization
For now, growth of data collected has outstripped engineers’ ability to analyze it all.

Testing Silicon Photonics In Production
Much work still needs to be done to reduce costs and improve speed, and that requires an entire ecosystem.

Using Analytics To Reduce Burn-In
Data-driven approach can significantly reduce manufacturing costs and time, but it’s not perfect.

Blogs

Editor in Chief Ed Sperling contends that interactions and optimization make it much harder to determine when a system will fail, or even what that failure really means, in Why AI Systems Are So Hard To Predict.

Synopsys’ Robert Ruiz lays out a new approach to DFT insertion that supports accurate, early verification and seamless handoff to downstream synthesis, in DFT For SoCs Is Last, First, And Everywhere In Between.

Advantest’s Fabio Pizza explains how to increase test coverage and improve product quality for mission-critical applications, in System-Level Test Methodologies Take Center Stage.

Sponsor White Paper

Part Average Test (PAT)
Part Average Testing explained — why it helps make automotive parts more reliable.