Top Stories

Racing To The Edge
The opportunity is daunting, but so are the challenges for making all the pieces work together.

New Approaches To Security
Data analytics, traffic patterns and restrictive policies emerge as ways to ensure that systems are secure.

3D NAND Metrology Challenges Growing
Rising costs and gaps in equipment emerge as technology scales; new tools under development.

Blogs

Editor In Chief Ed Sperling warns the tech world is planning for an onslaught of data, but it’s far from clear who will own it, in Preparing For War On The Edge.

Advantest’s Judy Davies contends that the emerging machine learning techniques are pushing the boundaries of what computers are capable of, in How Do I Know? A Machine Told Me So.

Mentor’s Rahul Singhal explains why AI-specific processors call for design-for-test techniques that boost time-to-market, in How To Manage DFT For AI Chips.

Sponsor White Papers

X-Ray Reveals Wire Bonding And Field Failures
An essential tool in initial stages of non-destructive IC failure analysis.

AI Chip DFT Techniques For Aggressive Time-To-Market
How to reduce design time on AI chips.

Fast Local Registration Measurements For Efficient E-Beam Writer Qualification And Correction
A novel approach to the e-beam mask writers’ local registration error offers critical sampling density at reasonable throughput.