Top Stories
New Uses For Manufacturing Data
Consistency, completeness and sharing of data can provide insights about a chip’s design, health and interactions, but it’s not that simple.
Sensing Automotive IC Failures
Improving reliability and yield will require new ways to identify defects in chips.
An Inside Look At Testing’s Leading Edge
FormFactor’s CEO peels back the covers on AI, 5G and HBM test issues.
Blogs
Editor in Chief Ed Sperling examines whether data can make chips more reliable, in Sensors, Data And Machine Learning.
yieldHUB’s Marie Ryan explains how to spend less time waiting for large files to download, in Home Analysis Of STDF Data.
FormFactor’s Thomas Funke demonstrates how reducing noise with cryogenic environments to enable improved sensor resolution and sensitivity, in Heating Up Cryogenic Wafer Testing.
Sponsor White Papers
5 Important Tips For Working With STDF
Five things to watch out for when dealing with Standard Data Test Format files. These issues are significant and knowledge about them can prevent confusion later on when processing STDF datalogs.
Online Deployment Of Robust Metrology Prediction Model
An online deployment of a robust prediction model for silicon carbide (SiC).
