Top Stories
More Semiconductor Data Moving To Cloud
A year ago many companies were unwilling to ship their data offsite. What changed?
How Many Test Miles Make A Vehicle Safe?
Simulation and test can improve safety, but that requires a standard framework and definitions.
Using Better Data To Shorten Test Time
More sensors plus machine learning are making it possible to focus testing where it has the most impact.
Blogs
Editor In Chief Ed Sperling argues that test may become the next bottleneck in design, in The Great Test Blur.
OptimalPlus’s Michael Schuldenfrei presents a checklist for using data more effectively, in 5 Steps To Data-Driven Manufacturing.
ProteanTecs’ Evelyn Landman explains how to use in-circuit monitoring and off-chip machine learning to improve reliability, in Degradation Monitoring — From Vision To Reality.
Mentor’s Vidya Neerkundar questions whether you can still take advantage of hierarchical DFT methods if you need to perform full-flat physical implementation, in Hierarchical DFT On A Flat Layout Design.
YieldHUB’s Kevin Robinson observes that although OSATs historically have performed outlier detection, more fabless companies are taking control in-house, in Who Is Responsible For Part Average Testing?
