Semiconductor Engineering Test, Measurement & Analytics

How Advanced Packaging Is Reshaping Inspection
Next-generation optical inspection is about more than just sensitivity. It’s about reliably seeing through complexity.

Rethinking Scan Chains In Semiconductor Test
Finding defects now requires multiple data types, and a much more thorough search.

Onto Innovation’s Cheolkyu Kim looks at thickness measurements of metal films during RDL and bond pad processes, in Using Picosecond Ultrasonic Technology For AI Packages: Part 2.

proteanTecs’ Alex Burlak finds that strong demand for advanced cloud SoCs powering training and inference is breaking assumptions about how fast the semiconductor market can shift, in GenAI’s Breakneck Pace Is Reshaping The Semiconductor Industry.

Teradyne’s Matthew Griffin explains why the growing adoption of optical interconnects in data centers necessitates high-volume, automated test solutions, in Testing At The Speed Of Light: Enabling Scalable Optical Testing For Silicon Photonics And CPO.

Siemens’ Marc Hutner shows how technology and system complexity drive the need for enhanced fault modeling and detection, in Addressing Silicon Lifecycle Scaling Demands.

Synopsys’ Guy Cortez details a systematic monitor analytics approach and how it evaluates power and performance of silicon from a small volume of test chips to a high volume of commercial devices, in On-chip Monitor Analytics Scales With Silicon Chip Production From NPI Through HVM.

PDF Solutions’ Jonathan Holt explains how semantic data models help to ensure data completeness and quality across the manufacturing lifecycle, in Harnessing The Power Of Data To Remain Competitive.

Advantest’s Roberto Colecchia talks about simplifying, securing, and automating the transfer of device test data between test floors, in The Data Dilemma In Semiconductor Testing And Why It Matters: Part 2.

Scaling GenAI Training And Inference Chips With Runtime Monitoring
A new approach for real-time monitoring of chip performance, power, and reliability.

Using High-Quality Deterministic Patterns For In-System/In-Field Testing
What happens when pseudo-random LBiST patterns are applied to complex designs in automotive and data centers?