Special Report
Fundamental Shifts In IC Manufacturing Processes
Emphasis transitions from speed to reliability and customization, slowing various process steps and changing when they are done; sidelined equipment gains traction.
Top Stories
Software-Driven And System-Level Tests Drive Chip Quality
A new system-level test for SoCs is gaining traction because it catches problems not detected at wafer probe and package test.
Auto Chipmakers Dig Down To 10ppb
Driving to 10 defective parts-per-billion quality is all about finding, predicting nuanced behavior in ICs.
HBM, Nanosheet FETs Drive X-Ray Fab Use
X-ray tools monitor chip alignment in HBM stacks and Si/SiGe composition in nanosheet transistors.
Blogs
Teradyne’s Ed Seng discusses the challenges of managing multisite test, in Site-To-Site Variation In Parallel Test.
Onto’s Wesley Chou points to the need to identify open defects earlier in the manufacturing process to limit the impact on yield, in Addressing The ABF Substrate Shortage With In-Line Monitoring.
Synopsys’ Rahul Singhal and Giri Podichetty illustrate test requirements of AI chips that integrate multiple dies and memories on the same package, in A Practical Approach To DFT For Large SoCs And AI Architectures, Part II.
Siemens EDA’s Aileen Ryan shows how extensive monitoring of silicon devices in the field helps improve reliability, safety, and security, in Enabling Silicon Lifecycle Solutions.
proteanTecs’ Uzi Baruch makes the case for using data to manage data center infrastructure, in Assuring Reliable Processor Performance At Scale.
Sponsor White Papers
Packetized Scan Test
Using DFT for complex SoCs with Tessent Streaming Scan Network.
Advanced High Throughput E-Beam Inspection With DirectScan
An eBeam inspection technology that scans random product layout patterns at billions of patterns of interest per hour.
Improving Performance And Simplifying Coding With XY Memory’s Implicit Parallelism
Adding the power of a digital signal processing engine to DesignWare ARC configurable processor cores to enable RISC and signal processing computation within a single unified architecture.
Weaving Digital Threads Into A Global Fabric Of Enterprise Knowledge
A case study shows how automated process control drives fast, easy improvements in process capability index (Cpk).
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