Top Stories

Chip Monitoring And Test Collaborate
What’s driving tighter interaction between processes, and what’s next.

Testing Analog Circuits Becoming More Difficult
Mixed signal content at advanced nodes and in packages is prompting alternative approaches.

Chasing Test Escapes In IC Manufacturing
Data analytics can greatly improve reliability, but cost tradeoffs are complicated.

Blogs

Editor in Chief Ed Sperling digs into the economics of reliability, in Recalculating The Cost Of Test.

Onto’s Woo Young Han zeroes in on the unique production and yield challenges of CMOS image sensors, in Understanding Optical Inspection For CIS.

Synopsys’ Ramsay Allen examines the dynamic conditions that have the potential to make or break a silicon product, in In-Chip Sensing And PVT Monitoring: Not Just An Insurance Policy.

Advantest’s Jose Moreira compares two ways to perform over-the-air test on antennas for 5G applications, in Testing AiP Modules In High-Volume Production.

FormFactor’s Paul Owen looks at the design of a critical part of the eight radio telescopes that make up the Submillimeter Array, in Cryostats Enable Astrophysics Research.

Sponsor White Papers

Acoustic Metrology For Fine Pitch Microbumps In 3D IC
Techniques for the measurement of multi-layer microbumps.

FPGA Prototyping: Supersizing Scale And Performance
Why prototyping with FPGAs are part of a pre-silicon verification and validation effort.

A Novel Memory Test System With An Electromagnet For STT-MRAM Testing
This memory test system with the electromagnet is a key testing tool for STT-MRAMs.