Top Stories
Using Predictive Maintenance To Boost IC Manufacturing Efficiency
Smarter tools enable smarter fabs, but the logistics of predictive maintenance challenge implementation.
The Future Of Fault Coverage In Chips
System-level test offers speed and lower cost, but there are limits to what it can do.
Doing More At Functional Test
New approaches for cutting costs and improving reliability for increasingly complex chips.
Blogs
Onto Innovation’s Mike McIntyre explains how device makers can access manufacturing details and recover some of the advantages that were lost when they shifted away from an OEM business model, in The Importance Of Secure Data Sharing.
Synopsys’ Hari Mani provides an automatic test pattern generation to automatic test equipment (ATPG-to-ATE) translation flow for creating high fault-coverage test vectors, in Supporting Multiple Time Domains In SoC Production Test.
NI’s Michael Bryner outlines the benefits of modular test systems, including swift integration into different product configurations and reduced costs, in Advancing Product Performance Through Adaptable Production Test Equipment.
Teradyne’s Thomas Koehler discusses how a battery management system improves range, extends battery life, and ensures Li-ion safety and reliability, in Battery Management Testing: Alleviating EV Buyer Anxiety.
Advantest’s Keith Schaub digs into HPC’s role in the technological revolution as companies pursue advanced, efficient, and accessible AI capabilities, in The Crucial Role Of High-Performance Computing In 2024: Balancing Cost And Innovation.
Sponsor White Papers
Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection
How to improve classification by using multiple models with unique algorithms.
Improvement Of High-Gradation DDIC Device Test Yield By T6391 High-Accuracy Measurement Solution
How to measure the output voltage of leading-edge display driver ICs with high accuracy.
Return On Investment Of A Pre-Reflow AOI System
A look at the benefits of installing an automated optical inspection system during the pre-reflow process.
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