Top Stories
Delivering On Power During HPC Test
1 volt is not the problem. It’s the 1,000+ amps.
Digital Twins Find Their Footing In IC Manufacturing
Technology will speed time to yield and add efficiency, but standards are needed for it to live up to its potential.
X-ray Inspection Becoming Essential In Advanced Packaging
Improvements in speed and precision have transformed a research tool for studying defects in chips into an industry workhorse.
Blogs
NI’s Juan Valdivia explains why the testing requirements for mixed signal and RF devices are becoming increasingly complex as industries evolve, in The Semiconductor Revolution And The Role Of Adaptable Testing.
Synopsys’ Guy Cortez and Mark Laird dig into the miscorrelation between predicted and actual silicon behavior, including issues when chips run too fast or too slow, in Reducing Design Margins With Silicon Model Calibration.
Advantest’s Toni Dirscherl outlines the challenges of testing an evolving list of auto devices, including DRAM, flash memory, MPUs, display drivers, and power devices, in Automotive Semiconductors Require Integrated Test Solution.
Sponsor White Papers
Effective Monitoring, Test, And Repair Of Multi-Die Designs
Test and diagnose known-good stacks and know-good dies, support extensive BIST capabilities, and offer in-field interconnect monitoring for purposes such as predictive maintenance.
Testing PAs Under Digital Predistortion And Dynamic Power Supply Conditions
Different techniques for testing power amplifiers.
Leveraging Machine Learning In Semiconductor Yield Analysis
Using ML and neural networks for automatic spatial pattern detection.
Real-Time Safety Monitoring For Predictive And Prescriptive Maintenance In Advanced Automotive Electronics
Deep data application for fault detection and failure prevention in mission-critical automotive applications.
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