Top Stories
Chip Aging Becomes Design Problem
Assessing the reliability of a device requires adding more physical factors into the analysis, many of which are interconnected in complex ways.
More Processing Everywhere
Arm’s CEO contends that a rise in data will fuel massive growth opportunities around AI and IoT, but there are significant challenges in making it all work properly.
Process Variation Not A Solved Issue
Experts at the Table: Biggest issues with process variation today, and its impacts on the design process.
Blogs
Editor in Chief Ed Sperling predicts scaling will take on a whole different look, and not just from feature shrinks, in More Performance At The Edge.
Cadence’s Rob Knoth explains why it’s critical to make power a key vector for design convergence, in Power Reduction In A Constrained World.
Rambus’ Liji Gopalakrishnan contends that emerging applications drive the need for high memory capacity, in High-Performance Memory At Low Cost Per Bit.
ANSYS’ Annapoorna Krishnaswamy observes that increased power density is ratcheting up power and thermal concerns, which need to be considered as early as possible, in Getting Ahead With Early Power Analysis.
Synopsys’ Ron Lowman argues that deep learning applications will require specialized IP in the form of new processing and memory architectures, in Impact Of IP On AI SoCs.
Helic’s Magdy Abadir examines how designers can detect increasing sensitivity to electromagnetic coupling, in Minimizing The Risk Of Electromagnetic Crosstalk Failures.
Fraunhofer’s Olaf Enge-Rosenblatt looks at the combination of data analytics and process knowledge to predict machine failures, in Predictive Maintenance In Tomorrow’s Industries.
Mentor’s Tom Fitzpatrick notes the fully updated and free how-to guide for UVM is now available, in Updated UVM Cookbook Supports IEEE 1800.2 Standard And Emulation.
Arm’s Brian Fuller finds more powerful edge devices are making AI applications like social robots feasible, in Pace Quickens As Machine Learning Moves To The Edge.
