Top Stories
The Race To Zero Defects
Complexity, scaling and economics are hindering test engineers from finding all of the faults.
Cobalt Shortages Ahead
Growth in electric vehicles and batteries is causing supply issues that could affect broad swaths of the electronics market.
Sorting Out Packaging Options
Experts at the Table, Part 1: Better naming conventions will reduce confusion over different packaging types, while cost, applications and standards will narrow the choices.
News
Intel Buys NetSpeed For NoC, Fabric IP
Startup becomes part of Intel’s Silicon Engineering Group; Intel shifts direction.
Blogs
Editor In Chief Ed Sperling argues that there’s no such thing as zero defects, particularly when you don’t know for sure what needs to be tested, in The Quest For Perfection.
Brewer Science’s Kim Yess examines materials changes that are needed to enable heterogeneous integration, in Solving Fan-Out Wafer-Level Warpage Challenges Using Material Science.
Advantest’s Judy Davies looks at the good and bad of 3D printing, in Digital Fabrication’s Promise And Potential Pitfalls.
Sponsor White Papers
5G Lessons Learned From Automotive Radar Test
Why radar is an entry point for millimeter-wave test, and what comes next.
Tessent Cell-Aware Test
How to reduce defect levels by targeting specific faults.
