Top Stories

Preventing Chips From Burning Up During Test
Scaling, packaging and a greater push for reliability add new challenges for testing chips.

Cloud Vs. On-Premise Analytics
Not all data analytics will move to the cloud, but the very thought of it represents a radical change.

Making Sure AI/ML Works In Test Systems
AI holds promise for improving reliability, but it’s not perfect yet.

Blogs

Editor in Chief Ed Sperling zeroes in on who wins and loses as more intelligence is added into devices, in The Other Side Of AI Reliability.

Onto Innovation’s Kevin Heidrich explains why increasingly extreme 3D NAND aspect ratios pose new manufacturing challenges, in Untangling 3D NAND: Tilt, Registration, And Misalignment.

Synopsys’ Guy Cortez digs into how SiliconDash is getting meaningful and actionable insights from the vast amount of available manufacturing data, in Finally, Analyzing All Test And Manufacturing Data Automatically.

Sponsor White Papers

Development Of Digital Controlled Technology For High Voltage DC Testing
The advantage of digital controlled technology that reduces testing time.

Controlling TC SAW Filter Frequency With Picosecond Ultrasonics
A demonstration of an acoustic metrology technique used in the TC-SAW process.

Fast Cycle Approximate Simulation Using ARC NSIM NCAM
Pre-silicon simulations with fast-functional and near cycle accurate modes.