Special Report
Data Confusion At The Edge
What happens when data is processed at uneven rates?
Top Stories
Inspection, Metrology Challenges Grow For SiC
Defects, scale remain problematic, but new tools may help.
5G Drives New Test Approaches
Lots of scans and testbeds, but not enough automation.
Video
Using ML For Post-Silicon Validation
Why machine learning is so effective in improving chip designs.
News
Hacking SoC IP Under Pressure
Hackfest culminates in race to find planted SoC bugs in 33 hours.
Blogs
Editor In Chief Ed Sperling finds test is taking on a whole new high-profile role in design, manufacturing, and post-production analysis, in Test Moving Forward And Backward.
Mentor’s Ron Press describes a new RTL-based hierarchical DFT flow for subsystems with Arm cores that promises better and more efficient testing, in Smart Plug-And-Play DFT For Arm Cores.
Delta’s Yavuz Kose explains why non-destructive SAM is an efficient tool for analyzing adhesion between layers and the presence of possible flaws in each layer, in Failure Analysis Of Electronic Devices Using Scanning Acoustic Microscopy.
Sponsor White Papers
Tessent Hierarchical ATPG Reference Flow For Arm Cortex-A75
How to speed up the implementation of a hierarchical test solution.
X-Ray Detects Hidden Failure Modes
How X-ray inspection can quickly locate the root cause of failures, to resolve production and lifecycle reliability issues.
Clean Focus, Dose And CD Metrology For CD Uniformity Improvement
Necessary steps to continue device scaling to new process nodes.
The 3 Big Data Mega Trends For Manufacturing
Smart manufacturers are embracing the digital revolution—IIoT, machine learning, artificial intelligence, predictive analytics and cloud-based infrastructure.
Extending 3D MRS Sensor Technology To Address Challenging Measurement And Inspection Applications
Fast, accurate 3D sensor technology for automated optical inspection, solder paste inspection and coordinate measurements.
Accurate Error Bit Mode Analysis Of STT-MRAM Chip With A Novel Current Measurement Module
Learn about a novel memory test system that can measure each cell’s switching current of STT-MRAM. The system was implemented in a gigabit class memory test system.
Why Choose NI For PMUs And Wide Area Monitoring
PMU-based instrumentation needs a platform strategy for instrumentation.
