Top Stories
Silicon Photonics Begins To Make Inroads
Maturing processes and new application areas open doors for extremely fast, low-power applications.
Big Shifts In Big Data
Why the growth of cloud and edge computing and the processing of more data will have a profound effect on semiconductor design and manufacturing.
5G OTA Test Not Ready For Production
High-volume, production-ready over-the-air testing systems don’t yet exist for 5G.
Blogs
Editor In Chief Ed Sperling observes that joint development of autonomous systems by carmakers is a necessary step, but what comes after that isn’t clear, in Paving The Way To Autonomous Driving.
Mentor’s Mohammed Abdelwahid digs into test access and scheduling challenges in meeting ISO 26262 functional safety requirements even with a robust in-system test, in Challenges Of Logic BiST In Automotive ICs.
YieldHub’s John O’Donnell offers practical ideas that engineers use to reduce test time, especially if they have a good database for test data, in Practical Ways To Reduce Test Time.
Delta’s Helle Ronsberg explains how to find failure sites that are hidden from optical view, in Deprocessing And SEM For Semiconductor Failure Analysis.
Optimal Plus’ Peter Hodgins demonstrates how to create automatic rules based on line data to proactively alert and react to problems before they result in scrap, in Manufacturing ADAS Cameras Calls For Analytics.
National Instruments’ Daniel Riedelbauch shares top automotive testing trends, in Highlights From The Automotive Testing Expo 2019.
