Special Report
Using AI To Improve Metrology Tooling
Virtual metrology shows benefits in limited trials, but much work still needs to be done.
Top Stories
What Data Center Chipmakers Can Learn From Automotive
Higher quality, lower cost, and faster time to market are requirements for both as rising complexity in vehicles overlaps with defectivity concerns in data centers.
Challenges In Photonics Testing
Alignment remains the top issue, but new developments could pave the way to high-volume manufacturing.
Challenges Grow For CD-SEMs At 5nm And Beyond
But this technology continues to evolve and keep pace with smaller features and increasing complexity.
Blogs
Onto Innovation’s Melvin Lee explains how to predict final test yield of wafers at the OSAT, in Using Machine Learning To Increase Yield And Lower Packaging Costs.
Synopsys’ Rahul Singhal and Likith Kumar Manchukonda show how to achieve a balance between test power and pattern count, in Power-Aware Test: Beyond Low-Power Test.
Advantest’s Dave Armstrong explains how AI-driven tools and broad-based data sharing will streamline structural and functional test selection, in Device Validation: The Ultimate Test Frontier.
Teradyne’s Tom Chambers highlights increased complexity and resolution as compounding challenges for image sensor testing, in Image Sensors Are Everywhere And The Implications For Test Are Significant.
DR YIELD’s Antonija Zagar digs into how integrating big data, smart data, and AI analytics produces yield insights and cost reductions, in What Is Achievable With A Yield Management System?
Sponsor White Paper
Case Study – Rohinni Micro LEDs
Rohinni adopts CyberOptics’ MRS-enabled SQ3000 multi-function system for inspection and metrology of Rohinni’s Micro LED technology.
eBook (Premium Content)
Power Semiconductors: A Deep Dive Into Materials, Manufacturing & Business
How these devices are made and work, challenges in manufacturing, related startups, as well as the reasons why so much effort and resources are being spent to develop new materials, and new processes. Includes inspecting, testing and measuring power semiconductors.
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