Top Stories
Hidden Impacts Of Software Updates
Over-the-air code changes can stress systems in unexpected ways.
Where And When End-To-End Analytics Works
Improving yield, reliability, and cost by leveraging more data.
How AI/ML Improves Fab Operations
Smart chip manufacturing is now a requirement, and it requires rethinking processes that have been in place for decades.
Bridging IC Design, Manufacturing, And In-Field Reliability
What goes wrong in complex chips, what can be done to fix them, and how to avoid issues in the future.
Lots Of Data, But Uncertainty About What To Do With It
Sensors are being added everywhere to monitor everything from aging effects to PVT, yet the industry is struggling to figure out the best ways to extract useful information.
Tech Talks
Deep Learning In Industrial Inspection
Using deep learning to find defects.
Blogs
KLA’s Rupa Velidandla looks at how to detect SiC substrate and epitaxial defects to drive quality and yield improvements, in Compound Semiconductor Innovation Advances EVs And Other Green Technologies.
Onto’s Johnny Dai breaks down how to measure multi-layer metal stacks of repeating metal films in the RF filter process flow, in Paving The Way For 5G: RF Filter Process Monitoring And Control Using Picosecond Ultrasonic Metrology.
Synopsys’ Ash Patel advises monitoring how process variation and aging affect timing of actual chips in real-world deployment, in Closing The Post-Silicon Timing Analysis Gap.
Advantest’s Ken Butler explains why using data analytics can keep the cost of test at reasonable levels without compromising quality or reliability, in Harnessing The Power Of Data In Semiconductor Test.
Siemens’ Richard Oxland finds that traditional software-only security measures aren’t enough to meet emerging security goals, in Cybersecurity Through Hardware-Based Threat Detection And Mitigation.
Teradyne’s Rick Burns looks at how next-generation devices with transistor counts in the hundreds of billions will be tested, in Semiconductor Test In The Gate All Around Era.
Sponsor White Papers
Automotive Safety Island
Management of test, safety, and security data at the edge for ISO 26262.
Novel E-Beam Techniques For Inspection And Monitoring
An advanced e-beam defect inspection tool allows for in-line inspection of nanometer-level defects in the most advanced technology nodes.
A Holistic Approach To Energy-Efficient System-On-Chip (SoC) Design
Energy efficiency through the system-on-chip (SoC) design flow, from architecture to signoff.
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