Top Stories
Next Steps For Improving Yield
Engineering teams are drowning in data at most advanced nodes; defining what is sufficient quality can vary by domain.
Legacy Tools, New Tricks: Optical 3D Inspection
White light interferometry and other optical approaches can help detect defects in advanced packages.
Test Connections Clean Up With Real-Time Maintenance
How to improve yield and prolong the life of probe cards and load boards.
Video
Automated Optical Inspection
Using machine learning to improve manufacturing quality.
Blogs
Onto Innovation’s John Chang, Corey Shay, James Webb, and Timothy Chang lay out why chiplets will require increasingly larger packages and more redistribution layers, in Heterogeneous Integration: Correcting Overlay Errors On Advanced Integrated Circuit Substrates (AICS).
Siemens’ Jayant D’Souza describes how using reverse scan chain diagnosis accelerates yield ramp, in How To Improve Yield Ramp For New Designs And Technology Nodes.
Synopsys’ Pawini Mahajan looks at making product development and deployment more deterministic, in Automotive Applications Demand Silicon Lifecycle Management.
CyberOptics’ Subodh Kulkarni summarizes the challenges in using traditional methods for measuring uniformity, in Bump Height Uniformity And 3D Sensing.
Teradyne’s Richard Fanning and John Rowe present small improvements in any test step that can reduce overall cycle time, in Simplifying The Path From Design To Test.
Sponsor White Papers
System Level Test — A Primer
System Level Test (SLT) is becoming essential as semiconductor geometries shrink.
Characterization Of HEMT Vias
The Zeta-Series optical profilers provide accurate measurement and automated analysis of high aspect ratio structures such as HEMT vias using non-destructive and high throughput metrology techniques.
Modeling Silicon Photonics Process Parameter Variations In Synopsys OptoCompiler-OptSim
Two of the approaches electronic-photonic circuit simulations can account for Monte Carlo process parameter variations during the design stage.
Super-Resolution Microscopy
Principles and advantages of super-resolution microscopy.
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