Special Report
Will 7nm And 5nm Really Happen?
New materials and transistors could extend Moore’s Law to 1.5nm or beyond, but there are a lot of problems ahead and a lot of unanswered questions.
Top Stories
Five Disruptive Test Technologies
More complexity will require more test coverage, longer test times, and possibly higher test costs. Changes are on the way.
Mobile Packaging Market Heats Up
Number of options for adding more features into chips grows beyond just 2.5D and 3D as mainstream packaging technologies run out of steam.
DFM And Multipatterning
Colors, no colors, and something in between; how long can multipatterning survive and where are the alternatives; collaboration becomes critical; the role of EUV.
Multi-beam Sees The Light
The technology has made significant progress in mask writing, but its future in direct-write litho remains in limbo.
Blogs
Editor In Chief Ed Sperling contends that even if EUV were to arrive tomorrow and work perfectly, multipatterning is here to stay, in How Much Multipatterning?
Has The IC Industry Hit A ‘Red Brick Wall’? Executive Editor Mark LaPedus investigates—and asks some important questions.
Technical Editor Katherine Derbyshire takes a glimpse into the future in More To Quantum Computing Than Qubits.
Mentor’s Carey Robertson and Steve Pateras say test and failure analysis takes on new importance because critical dimensions of finFETs are smaller than the underlying node size in Designing And Testing FinFET-based IC Designs.
Multibeam’s David Lam examines what’s missing in semiconductor lithography and what’s needed to finish the job in From The Whiteboard: David Lam.
Semico Research’s Joanne Itow finds the next big thing for cars isn’t so new in Ethernet: The Highway For Automotive Electronics?
Applied Materials’ Joseph Jeong and Tony Chao offer a behind-the-scenes looking at why their company is investing in a biotech company in Revolutionizing Biotechnology.
SEMI’s Paula Doe finds big changes in the test industry as the IC industry matures in SEMICON West Preview: Test.
Sponsor White Paper
Root Cause Deconvolution: Mentor Graphics discusses the next step in diagnosis resolution improvement.
