Top Stories

Challenges Grow For Finding Chip Defects
Costs are rising, and so is the time it takes to inspect a wafer.

Magnetic Memories Reach For Center Stage
Why MRAM technology works best for connected devices.

Using Machine Learning In Fabs
ML will augment existing manufacturing processes, but it won’t replace them.

Mixed Picture Seen For EUV Masks
The confidence level of EUV is high, but there are some gaps.

Blogs

Editor In Chief Ed Sperling finds 3D-ICs are gaining a foothold, but it’s still not easy, in Stacking Memory On Logic, Take Two.

Executive Editor Mark LaPedus reports that electric vehicle OEMs are forming alliances with SiC vendors, in SiC Market Moves Into Overdrive.

SEMI contributor Walt Custer explains how an uptick in Taiwan-based wafer foundry sales in August indicates semi and equipment growth could be on the horizon, in Early 2020 Looks Promising For Semi Industry.

Applied Ventures’ Michael Stewart digs into current market developments in machine learning and how they are affecting VC investment patterns, in VC Perspectives On An AI Summer.