Special Report
Auto Chip Testing Getting Harder
Each new level of assistance and autonomy adds new requirements and problems, some of which don’t have viable solutions today.
Top Stories
The Chiplet Race Begins
DARPA and a number of major vendors are backing this modular approach, but hurdles remain.
Return Of The Organic Interposer
Lower-cost options gain attention as chipmakers seek alternatives for 2.5D packaging.
Video
Printed Electronics Materials
Why printed electronics are finding their way into edge devices, and why materials choices are so critical.
Blogs
Editor In Chief Ed Sperling argues that complexity, advanced nodes, harsh conditions and safety concerns will make testing more time-consuming and expensive, in Who’s Paying For Auto Chip Test?
Advantest’s Judy Davies questions what it will take to make machines process information in the same way that we do, in Some Human Musings On Machine Learning.
Brewer Science’s Yongqing Jiang explains how to identify and track impurities before they make it onto the wafer, in The Next Generation Of Fingerprinting Technology.
Technology Editor Jeff Dorsch contends that TestVision 2020 may need a new moniker, in What’s In A Name?
Sponsor White Papers
Chord Signaling By Generalizing Differential Signals
Chord Signaling uses a multi-wire signaling approach that generalizes differential signaling. It sends more bits of data over more wires whilst keeping all of the desirable properties of differential signaling.
Save Time And Maximize Reuse In HIL Testing With The SLSC Extension For PXI And CompactRIO
The SLSC is a way to avoid some of the custom engineering inherent in hardware-in-the-loop (HIL) tests. NI explains SLSC and showcases the growing ecosystem of SLSC modules and accessories.
