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• Estimating the Embedded Gate Resistance to Reproduce SiC MOSFET Circuit Performance (ROHM)

  Published on October 6, 2023

• Meeting The Material Challenges Of Nano-CMOS Electronics

  Published on October 3, 2023

• Noise Parameter Survey Of Millimeter Wave GaN HEMT Technologies

  Published on October 3, 2023

• Integration Of Layered Semimetals With Conventional CMOS Platform

  Published on September 27, 2023

• Friction Between Single Layer Graphene And An Atomic Force Microscope Tip

  Published on September 27, 2023

• Neuromorphic Artificial Synaptic Device Combining Memristor Arrays With Copper Iodide

  Published on September 13, 2023

• A Perovskite-Derivative Nickelate Offering More Durable, Sustainable Multi-Level Non-Volatile Phase Change Memory

  Published on September 13, 2023

• Wafer-Scale CMOS-Integrated GFET Arrays With High Yield And Uniformity Designed For Biosensing Applications

  Published on September 6, 2023

• A New Layered Structure With 2D Material That Exhibits A Unique Transfer Of Energy And Charge

  Published on September 6, 2023

• An Eco-Friendly Conductive Ink For Thin-Film Electronics

  Published on September 6, 2023
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