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Home > Home > Category See More

Technical Paper Home

Manufacturing

  • Search Based Method For Identifying Aging Model Parameters

    Published on June 24, 2023
  • Nanosheet GAAFETs: Compact Modeling (Politecnico di Torino)

    Published on June 7, 2023
  • 3DICs: Legalizer Techniques For Better Routing Quality, Fewer DRVs, And Reduced Total Slack With Negligible Runtime Impact

    Published on June 7, 2023
  • 3D Memory Structures: Common Hole And Tilt Metrology Techniques and Capabilities

    Published on June 3, 2023
  • Latest Discoveries in the Mechanics of 2D Materials

    Published on May 31, 2023
  • ALD-Oxide Semiconductors: Summary, Benefits And Challenges

    Published on May 31, 2023
  • Non-Traditional Design of Dynamic Logic Gates and Circuits with FDSOI FETs

    Published on May 19, 2023
  • 28nm-HKMG-Based FeFET Devices For Synaptic Applications

    Published on May 9, 2023
  • Reconfigurability and NTC-based Signal Modulation Within a Single Ferroelectric TFET

    Published on May 9, 2023
  • NIST Releases “Vision And Strategy for the National Semiconductor Technology Center”

    Published on May 5, 2023
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