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Test, Measurement, Analytics tech papers

• Controlling Speckle Contrast Using Existing Lithographic Scanner Knobs to Understand LWR (Samsung, ASML)

  Published on January 29, 2025

• Wafer Bin Map Defect Classification Using Semi-Supervised Learning

  Published on December 27, 2024

• 98 Hardware Security Failure Scenarios (NIST)

  Published on December 3, 2024

• Monitor Etch Defects on Dies in the Outer Regions Of The Wafer Using ISR

  Published on November 26, 2024

• Visualization of Photoexcited Charges Moving Across the Interface of Si/Ge

  Published on November 5, 2024

• Characterizing Defects Inside Hexagonal Boron Nitride (KAIST, NYU, et al.)

  Published on October 23, 2024

• Scalability of Nanosheet Oxide FETs for Monolithic 3-D Integration

  Published on October 22, 2024

• Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

  Published on October 22, 2024

• Strain Engineering in 2D FETs (UCSB)

  Published on October 7, 2024

• Method To Determine The Permittivity of Dielectric Materials in 3D Integrated Structures At Broadband RF Frequencies

  Published on September 25, 2024
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