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Test, Measurement & Analytics

• Fault Awareness And Reliability Improvements In a Fault-Tolerant RISC-V SoC (HARV-SoC)

  Published on June 24, 2023

• Multi-Rate Discrete-Time Modeling Approach Of A Power Hardware-in-the-Loop Setup (Karlsruhe Institute of Technology)

  Published on June 7, 2023

• 3D Memory Structures: Common Hole And Tilt Metrology Techniques and Capabilities

  Published on June 3, 2023

• Latest Discoveries in the Mechanics of 2D Materials

  Published on May 31, 2023

• CDSAXS Milestones And Future Growth of X-ray-Based Metrology for 3D Nanostructures Important To Chip Industry

  Published on April 20, 2023

• More Accurate And Detailed Analysis of Semiconductor Defects In SEM Images Using SEMI-PointRend

  Published on March 10, 2023

• Fast Time-Resolved Scanning Tunneling Microscopy (STM) for Nanostructures

  Published on February 27, 2023

• Automotive MCUs: Digital Twin of the LBIST Functionality

  Published on February 15, 2023

• Detecting Hardware Trojans In a RISC-V Core’s Post-Layout Phase

  Published on February 8, 2023

• Wafer Scale Transfer of 2D Materials, Graphene

  Published on January 29, 2023
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