Technical Paper Home

Test, Measurement, Analytics tech papers

• 98 Hardware Security Failure Scenarios (NIST)

  Published on December 3, 2024

• Monitor Etch Defects on Dies in the Outer Regions Of The Wafer Using ISR

  Published on November 26, 2024

• Visualization of Photoexcited Charges Moving Across the Interface of Si/Ge

  Published on November 5, 2024

• Characterizing Defects Inside Hexagonal Boron Nitride (KAIST, NYU, et al.)

  Published on October 23, 2024

• Scalability of Nanosheet Oxide FETs for Monolithic 3-D Integration

  Published on October 22, 2024

• Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

  Published on October 22, 2024

• Strain Engineering in 2D FETs (UCSB)

  Published on October 7, 2024

• Method To Determine The Permittivity of Dielectric Materials in 3D Integrated Structures At Broadband RF Frequencies

  Published on September 25, 2024

• Relative Humidity in Conductive Atomic Force Microscopy (KAUST)

  Published on September 11, 2024

• Steps to Fabricate Nanotips Overhanging From Chip Edge By a Few Micrometers (CNRS, CEA-Leti)

  Published on September 10, 2024
Page 2 of 9
• 1
• 2
• 3
• 4
• 5
• 6
• 7
• 8
• 9