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Technical Paper Home

Power & Performance

  • Diamond Semiconductor: Highest Breakdown Voltage, Lowest Leakage Current

    Published on November 29, 2023
  • Secure NFC-Based Wireless Battery Management System

    Published on November 29, 2023
  • A Fast And Unified Toolchain For Rapid Design Space Exploration Of Chiplet Architectures

    Published on November 27, 2023
  • Lateral 3 kV AlN SBDs on Bulk AlN Substrates By MOCVD

    Published on November 27, 2023
  • Investigating Subthreshold Current Suppression in ReS2 Nanosheet-Based FETs

    Published on November 26, 2023
  • Fast Interrupt Extension For MCU RISC-V

    Published on November 20, 2023
  • Continuous Energy Monte Carlo Particle Transport On AI HW Accelerators

    Published on November 20, 2023
  • CMOS-Based HW Topology For Single-Cycle In-Memory XOR/XNOR Operations

    Published on November 7, 2023
  • Discrete Noise Approximation When Modeling The Effects Of Noise On Quantum Circuits

    Published on November 7, 2023
  • Potentials And Issues Of Designing Fault-Tolerant Hardware Acceleration For Edge-Computing Devices

    Published on October 31, 2023
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