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Technical Paper Home

  • Pushing the limits of EUV mask repair: addressing sub-10 nm defects with the next generation e-beam-based mask repair tool

    Published on December 7, 2021
  • A Novel Fundamental Frequency Switching Operation for Conventional VSI to Enable Single-Stage High-Gain Boost Inversion with ANN Tuned QWS Controller

    Published on December 7, 2021
  • Using Manufacturing Data To Boost Reliability

    Published on December 7, 2021
  • The 5G Rollout: Solving Advanced RF Metrology Challenges

    Published on December 7, 2021
  • Speeding Up Scan-Based Volume Diagnosis

    Published on December 7, 2021
  • Deep Learning Delivers Fast, Accurate Solutions For Object Detection In The Automated Optical Inspection Of Electronic Assemblies

    Published on December 7, 2021
  • Streaming Scan Network: An Efficient Packetized Data Network For Testing Of Complex SoCs

    Published on December 7, 2021
  • Optimizing System Performance At Runtime

    Published on December 7, 2021
  • HSIO Loopback Turns Challenges Into Opportunities For Test At 112 Gbps

    Published on December 7, 2021
  • Case Study — Deep Learning For Corner Fill Inspection And Metrology On Integrated Circuits

    Published on December 7, 2021
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