Technical Paper Home

• Pinpointing the Dominant Component of Contact Resistance to Atomically Thin Semiconductors

  Published on March 8, 2022

• SparseP: Towards Efficient Sparse Matrix Vector Multiplication on Real Processing-In-Memory Systems

  Published on March 8, 2022

• Zero-Bias Power-Detector Circuits based on MoS₂ Field-Effect Transistors on Wafer-Scale Flexible Substrates

  Published on March 8, 2022

• Digital Twin for Secure Semiconductor Lifecycle Management: Prospects and Applications

  Published on March 8, 2022

• Advances in Logic Locking: Past, Present, and Prospects

  Published on March 8, 2022

• Rethinking Watermark: Providing Proof of IP Ownership in Modern SoCs

  Published on March 8, 2022

• Interfacial ferroelectricity in marginally twisted 2D semiconductors

  Published on March 8, 2022

• Software-Driven and System-Level Tests Drive Chip Quality

  Published on March 8, 2022

• Addressing The ABF Substrate Shortage With In-Line Monitoring

  Published on March 8, 2022

• A Practical Approach To DFT For Large SoCs And AI Architectures, Part II

  Published on March 8, 2022
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