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Home > Home > Technologies
Knowledge Center
SEE ALL: Knowledge Centers / People / Entities / Technologies

    Automatic Test Pattern Generation

    AVM

    Behavioral Synthesis

    BSIM

    CAN bus

    CD-SEM

    CDC design principles

    Chip Thermal Interface Protocol

    CMOS

    Combinatorial Equivalence Checking

    Compiled-code Simulation

    Decoding ISO 26262

    Digital Oscilloscope

    Directed Self-Assembly

    e

    eBeam

    eRM

    EUV

    FinFET

    FlexRay

    FPGA

    HSA Platform System Architecture Specification

    HSA Programmer’s Reference Manual

    HSA Runtime Programmer’s Reference Manual

    IEEE 1076

    IEEE 1076.1

    IEEE 1076.1.1

    IEEE 1076.4

    IEEE 1149

    IEEE 1364

    IEEE 1364.1

    IEEE 1532

    IEEE 1647

    IEEE 1666

    IEEE 1685

    IEEE 1800

    IEEE 1800.2

    IEEE 1801

    IEEE 1838

    IEEE 1850

    IEEE P2415

    IEEE P2416

    IGBT

    Integrated Circuit

    IP-XACT

    ISO 26262

    LIN bus

    Litho Etch Litho Etch

    Lithography k1 coefficient

    Logic Simulation

    Metastability

    Multi-Beam eBeam Lithography

    Nanoimprint Lithography

    Optical Lithography

    OVM

    PODEM

    Property Specification Language

    Read Only Memory

    ReRAM materials

    RVM

    SCV

    Single transistor DRAM

    Software/Hardware Interface for Multicore/Manycore (SHIM) processors

    SPICE

    SystemC

    SystemC-AMS

    SystemVerilog

    Unified Coverage Interoperability Standard

    Unified Power Format

    URM

    UVM

    Vera

    Verilog

    Verilog Procedural Interface

    Verilog-AMS

    VHDL

    VMM

    Wide I/O

    X Architecture

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