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Technical Paper Home

  • Enabling SoC Visibility For Future Secure Hardware Architectures With In-Chip Environmental Monitoring

    Published on June 7, 2022
  • Trends In Testing: New Challenges Create New Opportunities

    Published on June 7, 2022
  • Silicon Lifecycle Management: Actionable Silicon Insights Through Intelligent Measurement And Analysis

    Published on June 7, 2022
  • Atomic Force Microscopy Covers The Landscape Of Polymer Characterization

    Published on June 7, 2022
  • New Method For BEOL Overlay And Process Margin Characterization

    Published on June 7, 2022
  • Measurement Of Deep Trenches To Study The RIE Lag Effect

    Published on June 7, 2022
  • System Level Test — A Primer

    Published on June 7, 2022
  • Semiconductor Test: Staying Ahead Of Nanodevices

    Published on June 7, 2022
  • Effect of Different Frequency Scaling Levels on Memory in Regard to Total Power Consumption in Mobile MPSoC

    Published on June 6, 2022
  • Fermi-level Tuning Improves Device Stability of 2D Transistors With Amorphous Gate Oxides

    Published on June 6, 2022
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