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• Ferroelectric, hafnium oxide based transistors for digital beyond von-Neumann computing

  Published on April 21, 2021

• Defect Mitigation And Characterization In Silicon Hardmask Materials

  Published on March 17, 2021

• The Decadal Plan for Semiconductors

  Published on February 8, 2021

• Pressure-induced Anderson-Mott transition in elemental tellurium

  Published on January 7, 2021

• Improving EUV Underlayer Coating Defectivity Using Point-Of-Use Filtration

  Published on November 18, 2020

• Graphene and two-dimensional materials for silicon technology

  Published on October 2, 2020

• Development Of Planarizing Spin-On Carbon Materials For High-Temperature Processes

  Published on August 20, 2020

• Super Planarizing Material For Trench And Via Arrays

  Published on May 21, 2020

• Thin Film Characterization For Advanced Patterning

  Published on March 18, 2020

• Design Comparison of SiC MOSFETs for Linear-Mode Operation

  Published on October 2, 2019
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