Applied Materials, Inc.

Popular Tags

Recent Comments

• Marc-David Levenson on 5nm Vs. 3nm
• Krishna Kireeti on 5nm Vs. 3nm
• David Leary on 5nm Vs. 3nm
• Mark LaPedus on Sidestepping Moore’s Law
• Piotr Grabowski on 5nm Vs. 3nm
• Kalle on 5nm Vs. 3nm
• miro on 5nm Vs. 3nm
• Rand Walker on 5nm Vs. 3nm
• Jim Handy on 3D NAND Race Faces Huge Tech And Cost Challenges
• Scott Stevens on Falling Chip Forecasts
• Joe Evans on Possible Uses Narrow For Negative Capacitance FETs
• Stefan Weilhartner on RISC-V Gains Its Footing
• Tanj Bennett on Sidestepping Moore’s Law
• Hybrid Electronics on Playing Into China’s Hands
• Lex LIU on Wrestling With High-Speed SerDes
• David Botma on Circuit Aging Becoming A Critical Consideration
• Charles R. on Circuit Aging Becoming A Critical Consideration
• Jon Peddie on Circuit Aging Becoming A Critical Consideration
• Tanj Bennett on 3D NAND Race Faces Huge Tech And Cost Challenges
• Brian Bailey on DAC 2019: Day 1
• steven Kim on 3D NAND Race Faces Huge Tech And Cost Challenges
• Danning on 3D NAND Race Faces Huge Tech And Cost Challenges
• Wayne Chen on Manufacturing Bits: June 10
• Mark LaPedus on 3D NAND Race Faces Huge Tech And Cost Challenges
• Katherine Derbyshire on Partitioning In 3D
• Geoff Koch on In Automotive, A Move From Microcontrollers To Massively Complex SoCs
• david on Training Tomorrow’s Chip Designers
• TimingIsEverything on DAC 2019: Day 1
• Sagar Patel on The Growing Uncertainty Of Sign-Off At 7/5nm
• Sylvain Muckenhirn on MicroLEDs: The Next Revolution In Displays?
• Lydell Aaron on How To Integrate An Embedded FPGA
• Gopal P on Controlling Variability And Cost At 3nm And Beyond
• Gil Russell on How Far Can AI Go?
• Kevin Cameron on In-Memory Computing Challenges Come Into Focus
• Semi_Eng_Fan_4321 on Partitioning In 3D
• Brian Bailey on The Case For Embedded FPGAs Strengthens And Widens
• Richard F. Wahl on 3D NAND Race Faces Huge Tech And Cost Challenges
• Endric Schubert / Missing Link Electronics on The Case For Embedded FPGAs Strengthens And Widens
• Mritunjay Kumar on SiC Demand Growing Faster Than Supply
• Mark LaPedus on 3D NAND Race Faces Huge Tech And Cost Challenges
• Eric Klien on 3D NAND Race Faces Huge Tech And Cost Challenges
• David Leary on What’s After FinFETs?
• Stephen Fairbanks on The Growing Uncertainty Of Sign-Off At 7/5nm
• John Wuethrich on Issues In Designing 5G Beamforming Antennas
• John Hallman on Can The Hardware Supply Chain Remain Secure?
• Clarisse GINET - CEO @Texplained on Can The Hardware Supply Chain Remain Secure?
• Capt. Obvious on Road Not Fully Constructed
• Mark LaPedus on Finding Defects In Chips With Machine Learning
• IQBAL SINGH Sabharwal on Cars, Security, And HW-SW Co-Design
• Applied_maths_guy on Finding Defects In Chips With Machine Learning
• Henry on EUV Mask Gaps And Issues
• Kevin Cameron on The Growing Uncertainty Of Sign-Off At 7/5nm
• masa on Return Of The Organic Interposer
• Carl on The Limits Of Energy Harvesting
• realjjj on The Limits Of Energy Harvesting
• SMS on Engineering Talent Shortage Now Top Risk Factor
• Alain Bensoussan on Gaps Emerge In Automotive Test
• Mdf on Quantum Effects At 7/5nm And Beyond
• Nitin on Finding Defects In Chips With Machine Learning
• Sam on Dude, Where’s My Autonomous Car?
• Brian engineer on Make Your Own Energy
• Infrequent Flyer on Road Not Fully Constructed
• Jack McIntosh on Road Not Fully Constructed
• realjjj on Make Your Own Energy
• Mark LaPedus on Electric Cars Gain Traction, But Challenges Remain
• Suresh on China’s Foundry Biz Takes Big Leap Forward
• Hank Walker on Electric Cars Gain Traction, But Challenges Remain
• Katherine Derbyshire on Finding The Source Of EUV Stochastic Effects
• Katherine Derbyshire on Finding The Source Of EUV Stochastic Effects
• C.S. Pawl on Understanding Memory
• Marc-David Levenson on Finding The Source Of EUV Stochastic Effects
• Priya Mukundhan on 3D NAND Metrology Challenges Growing
• DNR on 3D NAND Metrology Challenges Growing
• Barry Weavers on Finding The Source Of EUV Stochastic Effects
• Priya Mukundhan on 3D NAND Metrology Challenges Growing
• Twinkle Pandagre on VCSEL Technology Takes Off
• Brian Bailey on Target: 50% Reduction In Memory Power
• 10957 reader on Single Vs. Multi-Patterning EUV
• C. Hodson on Target: 50% Reduction In Memory Power
• Gil Russell on 3D NAND Metrology Challenges Growing
• neil on Target: 50% Reduction In Memory Power
• Computational Storage Dude on In-Memory Computing Challenges Come Into Focus
• Mark LaPedus on 3D NAND Metrology Challenges Growing
• Peter manoj on 3D NAND Metrology Challenges Growing
• David Stoddard on Silicon CMOS Architecture For A Spin-based Quantum Computer
• Jacob Monberg on Making high-capacity data caches more efficient
• John Evans on The 7nm Pileup
• Nick T on Mathematic Model Helps Predict Markets That Will Drive Semiconductor Growth
• Enchuan on Single Vs. Multi-Patterning EUV
• Suresh Kumar K Regonda on Finding Defects In Chips With Machine Learning
• Chandra on Machine Learning Meets IC Design
• Sally, displaced and re-engineered self on Engineering Talent Shortage Now Top Risk Factor
• Subodh Taigor on The Case For Antifuse OTP NVM For Secure & Reliable SoCs
• Wolfgang Roethig on IC Test: Doing It At The Right Place At The Right Time
• Katherine Derbyshire on EUV Arrives, But More Issues Ahead
• K. Goldberg on EUV Arrives, But More Issues Ahead
• jeffl on Making Chip Packaging Simpler
• Tejinder Singh on EUV Arrives, But More Issues Ahead
• Guest on EUV Arrives, But More Issues Ahead
• Riko R on A Different Kind Of Material World
• semi probes on The Mighty Sensor In The Fab
• Tony on Engineering Talent Shortage Now Top Risk Factor
• Pete Clarke on The Growing Challenge Of Thermal Guard-Banding
• Henry on More Lithography/Mask Challenges (part 1)
• Scott Jewler on Finding Defects In Chips With Machine Learning
• Mark LaPedus on Finding Defects In Chips With Machine Learning
• Carl Zweben on Shedding Pounds In Automotive Electronics
• John Eastwood on Making Autonomous Vehicles Safer
• Scott Jewler on Finding Defects In Chips With Machine Learning
• Navathej on Power Aware Intent And Structural Verification Of Low-Power Designs
• Guest on Defect Detection Strategies and Process Partitioning for SE EUV Patterning
• David J Leary on Chip Aging Accelerates
• nikilla on CMOS Image Sensors (CIS): Past, Present & Future
• Vojislav on In-Memory Computing Challenges Come Into Focus
• Brendan on Engineering Talent Shortage Now Top Risk Factor
• WILSON PARDI JUNIOR on Engineering Talent Shortage Now Top Risk Factor
• Ludo Vandenberk on Lithography Challenges For Fan-out
• Jeff on The Paradox Of Automotive Electronics
• Allen Rasafar on Transistor Options Beyond 3nm
• Allen Rasafar on Week In Review: Manufacturing, Test