Test, Measurement & Analytics

Top Stories

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it's not a simple technology to work with.

Gaps Emerge In Automotive Test

Reliability requires different parts to work in sync, and much more time-consuming testing and simulation.

Racing To The Edge

The opportunity is daunting, but so are the challenges for making all the pieces work together.

New Approaches To Security

Data analytics, traffic patterns and restrictive policies emerge as ways to ensure that systems are secure.

3D NAND Metrology Challenges Growing

Rising costs and gaps in equipment emerge as technology scales; new tools under development.

Gaps In 5G Test

Millimeter wave technology will require a whole new approach to ensuring reliability.

Finding Defects In Chips With Machine Learning

Better algorithms and more data could bolster adoption, particularly at advanced nodes.

Domain Expertise Becoming Essential For Analytics

More data doesn't mean much unless you know what to do with it.

Shedding Pounds In Automotive Electronics

Weight is suddenly a major concern for carmakers, but slimming down has repercussions.

Using Sensor Data To Improve Yield And Uptime

Deeper understanding of equipment behavior and market needs will have broad impact across the semiconductor supply chain.

More Top Stories »



Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »



Multimedia

Making AI More Dependable

Considerations in using AI to improve reliability in all chips.

Concurrent Test

The growing challenge to do more in the same time window.

AI In Chip Manufacturing

How AI with knowledge transfer can significantly decrease error rates and improve test.

Planarization Challenges At 7nm And Beyond

Why it's becoming harder to prepare a wafer at advanced nodes.

ATE Lab To Fab

How to close the gap between the design and test worlds to improve coverage and shorten time to market.

More Multimedia »



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Latest Blogs

Editor's Note

Here Come The Economists

The next wave of data analytics will be less about infrastructure and more ab...
May 7, 2019
The Human Machine Interface

3D Metal Printing: Does It Add Up?

As methods for additive manufacturing proliferate, in-house manufacturing is ...
Test For The Autonomous Age

Breakthrough For Scan Diagnosis With Machine Learning

Improve yield and failure analysis by detecting, refining, clarifying, and re...
Extraordinary ASICs

A Different Approach To Failure Analysis

Why wet chemical IC decapsulation is so important.
Inside Big Data

Data Sharing And Digital Threads

Share product information with members of the supply chain without exposing y...
Accelerating Design & Test

Modernizing Test In Aerospace And Defense

Test systems must evolve to keep pace with advancements in technology while s...

Knowledge Centers
Entities, people and technologies explored


  Trending Articles

The Limits Of Energy Harvesting

Why the promise of unlimited power in end devices has achieved only spotty success.

Chiplet Momentum Builds, Despite Tradeoffs

Pre-characterized tiles can move Moore’s Law forward, but it’s not as easy as it looks.

5G Heats Up Base Stations

Inefficient conversion of RF to digital and continuous connectivity issues are causing thermal problems, threatening signal integrity and reliability.

Creating A Roadmap For Hardware Security

Government and private organizations developing blueprints for semiconductor industry as threat level rises.

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it’s not a simple technology to work with.