Test, Measurement & Analytics

Top Stories

Different Ways To Improve Chip Reliability

Push toward zero defects requires more and different kinds of test in new places.

Test In New Frontiers: Flexible Circuits

How test is keeping up with technology changes.

Leveraging Data In Chipmaking

PDF Solution's CEO talks about the growing impact of analytics and AI on semiconductor design and manufacturing.

Reducing Costly Flaws In Heterogeneous Designs

Why finding and fixing errors in AI and automotive chips is so difficult.

Shrinking AV’s 1 Billion Test Miles

What makes an autonomous vehicle safe in real-world traffic situations?

Testing Against Changing Standards In Automotive

There is no right answer yet for autonomous vehicles, and that's causing problems.

How Hardware Can Bias AI Data

Degrading sensors and other devices can skew AI data in ways that are difficult to discern.

Test On New Technology’s Frontiers

Where the gaps are and what that means for coverage and reliability.

Nvidia’s Top Technologists Discuss The Future Of GPUs

Power, performance, architectures, and making AI pervasive.

More Semiconductor Data Moving To Cloud

A year ago many companies were unwilling to ship their data offsite. What changed?

More Top Stories »

Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »


Using Machine Learning To Break Down Silos

Different ways to use ML in semiconductor manufacturing.

How 5G Affects Test

How to ensure millimeter wave technology will be reliable enough.

Changes In Data Storage and Usage

Managing data lakes, silos, and different data types.

New Challenges In Testing 5G Devices

Complex hurdles in characterizing performance and optimizing signals.

Improving Quality Through Data Analytics

How to utilize data across different manufacturing processes.

More Multimedia »

See All Posts in Test Measurement and Analytics »

Latest Blogs

Editor's Note

AI’s Blind Spots

How AI/ML systems will age is not well understood, and that's a big problem.
November 12, 2019
Test For The Autonomous Age

A Breakthrough In Silicon Bring-Up

Erase the gap between automatic test equipment and DFT debug software to stre...
Accelerating Design & Test

Should We Even Be Talking About 6G?

It's exciting to look ahead to the next big thing, but there's still a lot le...
Inside Big Data

Building Powertrains To Meet EV Demand

Data helps optimize the manufacturing process of electric powertrains to make...
Semiconductor Yield Management

Software Support Scenarios

When to consider using a Software-as-a-Service model.
Scaling Electronics

From Womb To Tomb: A Lifetime Of Chip Data In A Common La...

How ongoing in-chip monitoring reveals ways to optimize performance and addre...
October 8, 2019
Extraordinary ASICs

Deprocessing And SEM For Semiconductor Failure Analysis

Finding failure sites that are hidden from optical view.
July 9, 2019

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

Revving Up For Edge Computing

New approaches to managing and processing data emerge, along with standard ways to compare them.

Week in Review: IoT, Security, Autos

Marvell & NAV Alliance; drone bill; Hyundai’s $35B plan; Intel’s edge play; 7nm certifications.

Power Semi Wars Begin

They won’t replace silicon, but GaN and SiC are becoming much more attractive as prices drop.

Week in Review: IoT, Security, Autos

Rambus completes Visa deal; CEVA licensing; Chinese hacking.

What’s The Best Advanced Packaging Option?

A dizzying array of choices and options pave the way for the next phase of scaling.