Test, Measurement & Analytics

Top Stories

Silicon Photonics Begins To Make Inroads

Maturing processes and new application areas open doors for extremely fast, low-power applications.

Big Shifts In Big Data

Why the growth of cloud and edge computing and the processing of more data will have a profound effect on semiconductor design and manufacturing.

5G OTA Test Not Ready For Production

High-volume, production-ready over-the-air testing systems don’t yet exist for 5G.

Inspection, Metrology Challenges Grow For SiC

Defects, scale remain problematic, but new tools may help.

5G Drives New Test Approaches

Lots of scans and testbeds, but not enough automation.

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it's not a simple technology to work with.

5G Heats Up Base Stations

Inefficient conversion of RF to digital and continuous connectivity issues are causing thermal problems, threatening signal integrity and reliability.

Gaps Emerge In Automotive Test

Reliability requires different parts to work in sync, and much more time-consuming testing and simulation.

Racing To The Edge

The opportunity is daunting, but so are the challenges for making all the pieces work together.

New Approaches To Security

Data analytics, traffic patterns and restrictive policies emerge as ways to ensure that systems are secure.

More Top Stories »

Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »


Using ML For Post-Silicon Validation

Why machine learning is so effective in improving chip designs.

ATE Lab To Fab

How to close the gap between the design and test worlds to improve coverage and shorten time to market.

Making AI More Dependable

Considerations in using AI to improve reliability in all chips.

Concurrent Test

The growing challenge to do more in the same time window.

AI In Chip Manufacturing

How AI with knowledge transfer can significantly decrease error rates and improve test.

More Multimedia »

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Latest Blogs

Editor's Note

Paving The Way To Autonomous Driving

Teaming up to get to market faster and for less cost is a necessary step, but...
July 9, 2019
Test For The Autonomous Age

Challenges Of Logic BiST In Automotive ICs

Meeting ISO 26262 functional safety requirements demands robust in-system tes...
Semiconductor Yield Management

Practical Ways To Reduce Test Time

A test program never refused tests.
Extraordinary ASICs

Deprocessing And SEM For Semiconductor Failure Analysis

Finding failure sites that are hidden from optical view.
Inside Big Data

Manufacturing ADAS Cameras Calls For Analytics

Create automatic rules based on line data to proactively alert and react to p...
Accelerating Design & Test

Highlights From The Automotive Testing Expo 2019

Active safety, vehicle electrification, and connectivity were big draws at th...

Knowledge Centers
Entities, people and technologies explored

  Trending Articles

5nm Vs. 3nm

Half nodes, different transistor types, and numerous other options are adding uncertainty everywhere.

Will Open-Source EDA Work?

DARPA program pushes for cheaper and simpler tools, but it may not be so easy.

Open Source Processors: Fact Or Fiction?

Calling an open-source processor free isn’t quite accurate.

Will In-Memory Processing Work?

Changes that sidestep von Neumann architecture could be key to low-power ML hardware.

Power Is Limiting Machine Learning Deployments

Rollouts are constrained by the amount of power consumed, and that may get worse before it gets better.