Test, Measurement & Analytics

Top Stories

Silicon Photonics Begins To Make Inroads

Maturing processes and new application areas open doors for extremely fast, low-power applications.

Big Shifts In Big Data

Why the growth of cloud and edge computing and the processing of more data will have a profound effect on semiconductor design and manufacturing.

5G OTA Test Not Ready For Production

High-volume, production-ready over-the-air testing systems don’t yet exist for 5G.

Inspection, Metrology Challenges Grow For SiC

Defects, scale remain problematic, but new tools may help.

5G Drives New Test Approaches

Lots of scans and testbeds, but not enough automation.

Challenges In Making And Testing STT-MRAM

Next-gen memory offers speed of SRAM and unlimited endurance, but it's not a simple technology to work with.

5G Heats Up Base Stations

Inefficient conversion of RF to digital and continuous connectivity issues are causing thermal problems, threatening signal integrity and reliability.

Gaps Emerge In Automotive Test

Reliability requires different parts to work in sync, and much more time-consuming testing and simulation.

Racing To The Edge

The opportunity is daunting, but so are the challenges for making all the pieces work together.

New Approaches To Security

Data analytics, traffic patterns and restrictive policies emerge as ways to ensure that systems are secure.

More Top Stories »



Round Tables

New 5G Hurdles

Experts at the Table, part 2: Getting 5G standards and technology ready are only part of the problem. Reducing latency and developing applications ...

Preparing For A 5G World

Experts at the table, part 1: Rising costs, massive complexity, and challenges in testing and simulating these devices will require some fundamenta...

More Roundtables »



Multimedia

Using ML For Post-Silicon Validation

Why machine learning is so effective in improving chip designs.

ATE Lab To Fab

How to close the gap between the design and test worlds to improve coverage and shorten time to market.

Making AI More Dependable

Considerations in using AI to improve reliability in all chips.

Concurrent Test

The growing challenge to do more in the same time window.

AI In Chip Manufacturing

How AI with knowledge transfer can significantly decrease error rates and improve test.

More Multimedia »



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  Trending Articles

5nm Vs. 3nm

Half nodes, different transistor types, and numerous other options are adding uncertainty everywhere.

Will Open-Source EDA Work?

DARPA program pushes for cheaper and simpler tools, but it may not be so easy.

Open Source Processors: Fact Or Fiction?

Calling an open-source processor free isn’t quite accurate.

Will In-Memory Processing Work?

Changes that sidestep von Neumann architecture could be key to low-power ML hardware.

Power Is Limiting Machine Learning Deployments

Rollouts are constrained by the amount of power consumed, and that may get worse before it gets better.