category: Test Measurement and Analytics

category: IoT, Security & Automotive

Things That Go Bump In The Daytime
By Ed Sperling - 14 Jan, 2020 - Comments: 0

There is no argument that autonomous technology is better at certain things than systems controlled by people. A computer-guided system has only one mission — to stay on the road, avoid object, and reach the end destination. It doesn't get tired, text, or look out the window. And it can park within a millimeter of a wall or another vehicle without hitting it, and do that every time — as lon... » read more

Improving In-System Test With Tessent VersaPoint Test Point Technology
By Mentor, a Siemens Business - 14 Jan, 2020 - Comments: 0

This paper describes a new versatile test point technology called VersaPoint, which has been developed specifically to work with designs implementing mixed EDT/LBIST methodologies to reduce EDT pattern counts and improve Logic BIST (LBIST) test coverage. VersaPoint test points can reduce compressed pattern counts 2X to 4X beyond compression alone and improve LBIST test coverage beyond what is p... » read more

Making 3D Structures And Packages More Reliable
By Ed Sperling - 14 Jan, 2020 - Comments: 0

The move to smaller vertical structures and complex packaging schemes is straining existing testing approaches, particularly in heterogeneous combinations on a single chip and in multi-die packages. The complexity of these devices has exploded with the slowdown in scaling, as chipmakers turn to architectural solutions and new transistor structures rather than just relying on shrinking featur... » read more

Extreme Quality Semiconductor Manufacturing, Part 1: Automotive
By Ben Tsai - 14 Jan, 2020 - Comments: 0

By Ben Tsai and Cathy Perry Sullivan Across the full range of semiconductor device types and design nodes, there is a drive to produce chips with significantly higher quality. Automotive, IoT and other industrial applications require chips that achieve very high reliability over a long period of time, and some of these chips must maintain reliable performance while operating in an environmen... » read more

Planning Ahead For In-System Test Of Automotive ICs
By Jeff Mayer - 14 Jan, 2020 - Comments: 0

Automobiles are increasingly more like electronic devices than mechanical platforms. As a share of the total cost of a car, electronics components have grown from about 5% in 1970 to 35% in 2010. Electronics are projected to account for 50% by 2030 (Deloitte, 2019). Some of the electronics are for passive operations, like display or In-Vehicle Infotainment (IVI) systems, but a growing proportio... » read more

The Impact Of Test Engineers
By Marie Ryan - 14 Jan, 2020 - Comments: 0

As testing is at the end of each project, it’s often seen as a non-value-added necessity that just needs to be done. This is why Test Engineers often feel overlooked and undervalued. Previously, we explained why engineering managers should value their test engineers, and told them how to get the most out of their teams. Today we’ll explore how test engineers can learn to understand the... » read more

Automakers Changing Tactics On Reliability
By Susan Rambo - 14 Jan, 2020 - Comments: 0

Automakers are beginning to rethink how to ensure automotive electronics will remain reliable over their projected lifetimes, focusing their efforts on redundancy, more data-centric architectures and continued testing throughout the life of a vehicle. It is still too early to really know how automotive chips actually will perform over the next 15 to 20 years, especially AI logic developed at... » read more

Advanced Features Of High-Speed Digital I/O Devices: Timing
By National Instruments - 14 Jan, 2020 - Comments: 0

In digital communication, timing is the most essential element. Any kind of violation to timing could cause you to transmit or receive incorrect data. As instruments and communication rates get faster, timing becomes even more vital, as even the smallest of changes in edges (in the pico-second range), could cause incorrect tests and communication failures. In the following paragraphs, discover ... » read more

Better Object Arrangement In Block Diagrams
By Jon Soneson - 14 Jan, 2020 - Comments: 0

How many of you have spent countless hours and worn down your keyboard arrows cleaning up LabVIEW block diagrams? LabVIEW block diagrams help you move any object 1 pixel at a time. Though this feature gives you a lot of flexibility, it also makes arranging objects on a diagram extremely tedious. When designing the LabVIEW NXG diagram, we aimed to reduce the monotony of this task and make you mo... » read more

Big Growth Areas: Connectivity, AI, Reliability
By Brian Bailey - 14 Jan, 2020 - Comments: 0

Connectivity and artificial intelligence (AI) will be the biggest drivers for 2020, with an emphasis on improved reliability across all areas. New standards, new applications, and new pressures being placed on old technology will created boundless opportunities for those ready to fill the need. Of course, there will also be a lot of carnage along the way, and we can expect to see a lot of that ... » read more

← Older posts

  • Sponsors

About

Navigation

Connect With Us

Copyright ©2013-2020 SMG   |  Terms of Service  |  Privacy Policy