category: Test Measurement and Analytics

category: IoT, Security & Automotive

Machine Learning For ADAS Camera Manufacturing
By Peter Hodgins - 16 Sep, 2019 - Comments: 0

Virtually every vehicle manufacturer in the world is either developing, purchasing, or investing in ADAS systems in order to bring autonomous vehicles into the market. With this demand on the rise, the need for high quality automotive camera modules is rising. ADAS systems are built using computer vision technology and act as the “eyes” of autonomous vehicles. Numerous cameras are embedd... » read more

Improving Quality Through Data Analytics
By Ed Sperling - 11 Sep, 2019 - Comments: 0

Doug Elder, vice president and general manager at OptimalPlus, explains how to utilize data to improve reliability, how it applies to different manufacturing processes, and what happens when that data is made available to more people within an organization. » read more

The Critical But Less Obvious Risks In AI
By Ed Sperling - 10 Sep, 2019 - Comments: 0

AI has been the subject of intense debate since it was first introduced back in the mid-1950s, but the real threat is a lot more mundane and potentially even more serious than the fear-inducing picture painted by its critics. Replacing jobs with technology has been a controversial subject for more than a century. AI is a relative newcomer in that debate. While the term "artificial intelligen... » read more

How Hardware Can Bias AI Data
By Ed Sperling - 10 Sep, 2019 - Comments: 1

Clean data is essential to good results in AI and machine learning, but data can become biased and less accurate at multiple stages in its lifetime—from moment it is generated all the way through to when it is processed—and it can happen in ways that are not always obvious and often difficult to discern. Blatant data corruption produces erroneous results that are relatively easy to ident... » read more

Test On New Technology’s Frontiers
By Ed Sperling And Susan Rambo - 10 Sep, 2019 - Comments: 2

Semiconductor testing is getting more complicated, more time-consuming, and increasingly it requires new approaches that have not been fully proven because the technologies they are addressing are so new. Several significant shifts are underway that make achieving full test coverage much more difficult and confidence in the outcome less certain. Among them: Devices are more connected an... » read more

Looking To Unlicensed Spectrum For 5G
By James Kimery - 10 Sep, 2019 - Comments: 0

When the International Telecom Union (ITU) outlined the key objectives for 5G, the 3GPP faced the difficult task of expanding the capabilities of the current wireless network under the constraint of limited spectrum. Spectrum equates to bandwidth, and the industry needs more spectrum to increase data rates and address specific use cases beyond 4G. Unfortunately, there isn’t much unoccupied sp... » read more

The Hidden Potential Of Test Engineers
By Marie Ryan - 10 Sep, 2019 - Comments: 0

Design engineers are seen as the cornerstone of new projects in many semiconductor companies, working away with the team to design the next product and making sure it meets all specifications. We pay little thought to the test engineer, who works in the shadows designing algorithms, hardware and software that could pass or fail each die. The test engineer is the last line of defense between... » read more

Nvidia’s Top Technologists Discuss The Future Of GPUs
By Ed Sperling And Susan Rambo - 10 Sep, 2019 - Comments: 0

Semiconductor Engineering sat down to discuss the role of the GPU in artificial intelligence, autonomous and assisted driving, advanced packaging and heterogeneous architectures with Bill Dally, Nvidia’s chief scientist, and Jonah Alben, senior vice president of Nvidia’s GPU engineering, at IEEE’s Hot Chips 2019 conference. What follows are excerpts of that conversation. SE: There are ... » read more

Highly Efficient Scan Diagnosis With Dynamic Partitioning
By Jayant D'Souza - 10 Sep, 2019 - Comments: 0

Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly and efficiently. Typically, they use volume scan diagnosis to generate large amounts of data from failing test cycles, which is then analyzed to reveal the location of defects. Scan failure data provides the basis for many decisions in the failure analysis and yield impro... » read more

Improve Volume Scan Diagnosis Throughput 10X With Dynamic Partitioning
By Mentor, a Siemens Business - 09 Sep, 2019 - Comments: 0

Performing volume scan diagnosis on today’s large, advanced node designs puts demands on turn-around-time and compute resources. This paper describes a new technique to maximize diagnosis throughput while performing ever more demanding scan diagnosis. The dynamic partitioning technology in Tessent Diagnosis enables in a 50% reduction in scan diagnosis time using only 20% of the typical memory... » read more

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