Jeff Dorsch

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Jeff Dorsch is a former contributing editor at Semiconductor Engineering.

Author's Latest Posts

The Week In Review: IoT
By Jeff Dorsch - 28 Apr, 2017 - Comments: 0

Finance SENSORO reports receiving $18 million in Series B funding from Robert Bosch Venture Capital, Sumitomo, and Tsing Capital. Nokia Growth Partners provided $10 million in first-round financing two years ago. SENSORO, which provides Internet of Things sensor devices and network technology, was established in 2013 as part of the Microsoft Accelerator program. Daylight Investors of Los An... » read more

The Week In Review: IoT
By Jeff Dorsch - 21 Apr, 2017 - Comments: 0

Finance August Home (formerly known as Kease), a San Francisco-based supplier of smart door locks and doorbell cameras, reports raising about $17.7 million from venture capitalists, with plans to lock down just shy of $25 million in private funding. The information was disclosed in a Form D filing with the Securities and Exchange Commission. Protocols Comcast has joined the LoRa Alliance a... » read more

The Week In Review: IoT
By Jeff Dorsch - 14 Apr, 2017 - Comments: 0

Resources AT&T Partner Exchange is providing new Internet of Things resources to its value-added resellers and other channel partners. They include the AT&T IoT Starter Kit, an IoT Readiness Assessment tool, and “A Channel Executive’s Guide to IoT.” The new tools work with the AT&T Control Center, the IoT platform the carrier introduced in 2016. Deals Tech Data is working with Propel... » read more

Time For Massively Parallel Testing
By Jeff Dorsch - 12 Apr, 2017 - Comments: 0

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory devices and other semiconductors, test equipment vendors have resorted to parallel testing technology, simultaneously testing multiple chips at a time. The industry also is turning to system-level tes... » read more

Looking Back at Board Test
By Jeff Dorsch - 10 Apr, 2017 - Comments: 0

Printed circuit board testing has been around as long as printed circuit boards, also known as printed circuit assemblies and printed wiring boards. PCB technology started in the early 20th century with Thomas Edison and other inventors. As boards shrink to fit inside wearable gadgets and other products with compact form factors, PCB test equipment vendors are addressing new challenges. Boar... » read more

How Testing MEMS, Sensors Is Different
By Jeff Dorsch - 10 Apr, 2017 - Comments: 2

When it comes to testing microelectromechanical system devices and sensors, sometimes you have to shake and bake. [getkc id="311" comment="MEMS"] and [getkc id="187" kc_name="sensors"] are physically different from standard ICs. They require a specific type of stimulus to get the required testing results. Most chips only need to have an electrical charge run through them to gauge their pass/... » read more

The Week In Review: IoT
By Jeff Dorsch - 07 Apr, 2017 - Comments: 0

Mergers & Acquisitions Qualcomm reported that the waiting period under the Hart-Scott-Rodino Antitrust Improvements Act of 1976 expired on Monday, April 3, clearing the chip design company’s proposed $47 billion acquisition of NXP Semiconductors, at least in the eyes of U.S. antitrust regulators. Qualcomm expects to close the transaction, which will create an Internet of Things powerhouse, b... » read more

LiDAR Completes Sensing Triumvirate
By Jeff Dorsch - 06 Apr, 2017 - Comments: 3

Fully autonomous vehicles of the future will depend on a combination of different sensing technologies – advanced vision systems, radar, and light imaging, detection, and ranging (LiDAR). Of the three, LiDAR is now the costliest part of that equation, and there are worldwide efforts to bring down those costs. Mechanical LiDAR units are currently available, priced in the hundreds of dollars... » read more

The Week In Review: IoT
By Jeff Dorsch - 31 Mar, 2017 - Comments: 0

Products NXP Semiconductors this week brought out several Internet of Things devices and other products for using near-field communications in advanced product authentication, integrity assurance, and enhanced user engagement in consumer manufactured goods, health care, retail, and other industries. The company has introduced the NTAG 413 DNA and NTAG 213 Tag Tamper devices to combat fake prod... » read more

EEMBC Offers Benchmark for Bluetooth LE in IoT
By Jeff Dorsch - 27 Mar, 2017 - Comments: 0

The Embedded Microprocessor Benchmark Consortium is introducing the IoTMark-BLE benchmark, for certifying the performance of devices using the Bluetooth Low Energy wireless protocol for Internet of Things applications. It is the first in the group’s IoT-Connect benchmark series. EEMBC also is preparing the ULPBench 2.0 standard, which will test the ultra-low-power capabilities of connected... » read more

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