Laura Peters

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Laura Peters is senior executive editor for manufacturing and test at Semiconductor Engineering.

Author's Latest Posts

Cryogenic Etch: A Key Enabler Of 3D NAND

By Laura Peters - 05 Jan, 2026 - Comments: 0

Increased storage needs at the edge and in the cloud are fueling rising demand for higher-capacity flash memory across multiple applications. Released every 12 to 18 months, 3D NAND scaling outpaces most other semiconductor devices in replacement rate and performance gains. With each new generation, NAND suppliers deliver 50% faster read/write speeds, 40% greater bit density, lower latency, ... » read more

Metrology Digs Deep To Produce Next-Generation 3D NAND

By Laura Peters - 09 Dec, 2025 - Comments: 1

Each generation of 3D NAND packs about 30% more bits than the previous version, with current devices storing up to 2 terabits of data in a die the size of a fingernail. With new product introductions shrinking from 18 months to every 12 months, chipmakers are constantly innovating to enable this prodigious scaling pace. 3D NAND technology is a core ingredient in mobile phones, solid-state dr... » read more

3DKs: Making Headway On Chiplet Standards

By Laura Peters - 01 Dec, 2025 - Comments: 0

The chiplet model has been proven by the early adopters. Large companies that successfully developed chips at leading nodes have integrated multiple chiplets into systems, where the entire silicon cycle is performed in-house. But the industry’s long-term goal of a free and open chiplet marketplace, in which companies of any size can reap the rewards and economies of scale associated with mult... » read more

HBM Leads The Way To Defect-Free Bumps

By Laura Peters - 11 Nov, 2025 - Comments: 0

High-bandwidth memory stands at the forefront of multiple technology developments as a critical enabler of AI, but it is one of the most difficult modules to manufacture. Leading HBM device makers and foundries must simultaneously handle multi-layer chip stacking, die warpage, and shorter product lifecycles that are shrinking from two years down to just one. But perhaps the most formidable c... » read more

Powering Efficiency: AI Transforms IC Manufacturing As ICs Fuel AI

By Laura Peters - 23 Oct, 2025 - Comments: 0

The push to grow today’s $500 billion-plus semiconductor industry to $1 trillion in annual revenue is challenging every aspect of the broader supply chain to embrace AI. Artificial intelligence is transforming the way fabs are architected and run, how devices are manufactured, and how server farms are constructed going forward. At the same time, all of this is being enabled by advancements... » read more

New Frontiers In Fault Detection And Classification

By Laura Peters - 14 Oct, 2025 - Comments: 0

IC manufacturers are increasingly relying on intelligent data processing to prevent downtime, improve yields, and reduce scrap. They are integrating that with fault detection and classification (FDC) to trace faults to their cause. Today’s FDC systems feature better sensors, variability control, and both predictive and prescriptive modeling. In the future, FDC will enable real-time decisio... » read more

Mitigating Warpage In Multi-Chiplet Systems

By Laura Peters - 22 Sep, 2025 - Comments: 0

Warpage of dies, redistribution layers, and interposers is a growing problem in multi-chiplet packages, and it can have a dramatic impact on the behavior and reliability of these devices. Multiple factors contribute to warpage, including larger chip sizes, severe thinning of the silicon substrate, temporary bonding and debonding processes, and scaling of bump pitch and size. Each of these ca... » read more

Glass Substrates Gain Momentum

By Laura Peters - 18 Sep, 2025 - Comments: 1

As a package substrate, the benefits of glass are substantial. It's extremely flat with lower thermal expansion than organic substrates, which simplifies lithography. And that's just for starters. Warpage, a growing problem for multichip packages, is greatly reduced. Chips can be hybrid bonded to redistribution layer pads on glass. And relative to organic-core substrates, glass provides very... » read more

Making The Most of Test Resources

By Laura Peters - 09 Sep, 2025 - Comments: 0

Semiconductor testing is undergoing multiple paradigm changes at once with the common goals of producing more known good die per month with low test cost. Achieving these goals requires a delicate balance between yield, quality, and test times. There are multiple ways to go about making better use of existing resources, many of which involve an increasing use of design for test (DFT) methods... » read more

Transforming Test For Co-packaged Optics

By Laura Peters - 12 Aug, 2025 - Comments: 0

Data centers are undergoing a dramatic transformation to reduce the power consumption of high-speed data transmissions by 70% or more with co-packaged optics. By moving optical transceivers from the fronts of racks into the same package as the networking switch and HBMs, AI programs that used to take a week to run can now be completed in a day. To enable this change in production manufacturi... » read more

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