The Challenges Of Testing Automotive Chips

By Pawini Mahajan - 10 Jun, 2025 - Comments: 0

For as long as semiconductor devices have been around, motor vehicles have been one of the toughest operating environments. Chips in automobiles, trucks, and buses are subject to extremes of temperature, humidity, vibration, and radiation. The challenges of designing for these environmental conditions have grown more pronounced with advanced technology nodes, which are necessary to satisfy mark... » read more

Importance Of Certifications In Automotive IP

By Pawini Mahajan - 10 Oct, 2023 - Comments: 0

The automotive industry is renowned for its unwavering commitment to enforcing strict standards for enabling safety, quality, reliability, and security. However, upholding stringent measures to ensure vehicle safety and reliability has led to the need for predictive maintenance i.e., using advanced monitoring and analytical techniques as a part of Silicon Lifecycle Management (SLM) to anticipat... » read more

Testability Analysis Based On Ever-Evolving Technology

By Pawini Mahajan - 06 Dec, 2022 - Comments: 0

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by high gate counts and an array of internally developed and third-party IP integrated into their designs. Understanding if one can create high-quality manufacturing tests for these complex designs mus... » read more

Automotive Applications Demand Silicon Lifecycle Management

By Pawini Mahajan - 08 Nov, 2022 - Comments: 0

Every electrical engineer learns early in university studies that automobiles are a highly demanding environment for electronics. Temperature and humidity extremes, noise and vibration, electrical interference, exposure to alpha particles, and other factors all make it hard to design and manufacture chips that will operate properly under all conditions. These challenges are exacerbated as chips... » read more

Signal Connectivity Checks Are Not Just For Design-For-Test Teams

By Pawini Mahajan - 08 Jun, 2021 - Comments: 0

By Pawini Mahajan and Raja Koneru The complexity with system-on-chip (SoC) design continues to grow, creating greater complexity of the corresponding design-for-test (DFT) logic required for manufacturing tests. Design teams are challenged not only by high gate counts and the array of internally developed and third-party IP integrated into their designs: the need to achieve high-quality manu... » read more