Adam Cron

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Adam Cron is a Distinguished Architect at Synopsys, working with customers worldwide on complex Test, Security, and Silicon Lifecycle Management tool flows and architectures for digital ICs. He has led the development of design-for-test and related technologies across multiple product generations and has held long-standing leadership roles in IEEE test standards, including Chair of IEEE Std 1838 and Editor of IEEE Std 1149.4. Cron is an IEEE Golden Core recipient and has received multiple IEEE honors, including the 2024 Hans Karlsson Standards Award and the 2025 IEEE SA Lifetime Achievement Award, and is a frequent speaker and author in the electronic testing community.

Author's Latest Posts

Enhancing Silicon Reliability With In-System Test And SLM Data

By Adam Cron - 07 Apr, 2026 - Comments: 0

Innovation in semiconductor development and manufacturing shows no signs of slowing down. Ever-larger chips at ever-smaller geometries create new challenges all the time. At the same time, competitive pressures are shrinking time to market (TTM) and putting enormous pressure on project teams. Furthermore, the wide use of electronics in safety-critical applications demands better reliability, av... » read more

EDA Forms The Basis For Designing Secure Systems

By Adam Cron - 03 Aug, 2020 - Comments: 0

By Adam Cron and Brandon Wang As Internet of Things (IoT) devices rapidly increase in popularity and deployment, security risks are arising at all levels. It could be at the usability level such as social engineering, pretexting, phishing; at the primitive level such as cryptanalysis; at the software level such as client-side scripting, code injection; and now even at the hardware level. Dur... » read more