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Ann Mutschler

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Ann Mutschler is senior executive editor at Semiconductor Engineering.

Author's Latest Posts

Challenges In Using AI In Verification
By Ann Mutschler - 27 Aug, 2020 - Comments: 0

Pressure to use AI/ML techniques in design and verification is growing as the amount of data generated from complex chips continues to explode, but how to begin building those capabilities into tools, flows and methodologies isn't always obvious. For starters, there is debate about whether the data needs to be better understood before those techniques are used, or whether it's best to figure... » read more

Preparing For A Barrage Of Physical Effects
By Ann Mutschler - 13 Aug, 2020 - Comments: 0

Advancements in 3D transistors and packaging continue to enable better power and performance in a given footprint, but they also require more attention to physical effects stemming from both increased density and vertical stacking. Even in planar chips developed at 3nm, it will be more difficult to build both thin and thick oxide devices, which will have an impact on everything from power to... » read more

Virtualization In The Car
By Ann Mutschler - 06 Aug, 2020 - Comments: 1

As the automotive industry grapples with complexity due to electrification and increasing autonomy of vehicles, consolidation of ECUs within vehicles, more stringent safety and security requirements, automotive ecosystem players are looking to virtualization concepts in a number of ways to realize the vehicles of tomorrow. One way is with hardware virtualization; the ability of a device such... » read more

Problems And Solutions In Analog Design
By Ann Mutschler - 05 Aug, 2020 - Comments: 1

Advanced chip design is becoming a great equalizer for analog and digital at each new node. Analog IP has more digital circuitry, and digital designs are more susceptible to kinds of noise and signal disruption that have plagued analog designs for years. This is making the design, test and packaging of SoCs much more complicated. Analog components cause the most chip production test failures... » read more

Pivoting Toward Safety-Critical Verification In Cars
By Ann Mutschler - 31 Jul, 2020 - Comments: 1

The inclusion of AI chips in automotive and increasingly in avionics has put a spotlight on advanced-node designs that can meet all of the ASIL-D requirements for temperature and stress. How should designers approach this task, particularly when these devices need to last longer than the applications? Semiconductor Engineering sat down to discuss these issues with Kurt Shuler, vice president of... » read more

Universal Verification Methodology Running Out Of Steam
By Ann Mutschler - 30 Jul, 2020 - Comments: 2

For the past decade or so, the Universal Verification Methodology (UVM) has been the de facto verification methodology supported by the entire EDA industry. But as chips become more heterogeneous, more complex, and significantly larger, UVM is running out of steam. Consensus is building that some fundamental changes are required, moving tools up a level of abstraction and making them more ag... » read more

EDA On Board With New Package Options
By Ann Mutschler - 22 Jul, 2020 - Comments: 2

A groundswell of activity around multi-die integration and advanced packaging is pushing EDA companies to develop integration strategies that speed up time to sign-off, increase confidence that a design will work as expected, while still leaving enough room for highly customized solutions. Challenges range from how to architect a design, how to explore the best options and configurations, ho... » read more

DAC 2020 Day One
By Ann Mutschler - 21 Jul, 2020 - Comments: 0

DAC 2020 is like no other Design Automation Conference. It is virtual for this year — and hopefully only this year. The COVID pandemic has proven that face-to-face meetings and conferences are invaluable for many reasons. But with none of the distractions of a traditional conference, focusing on the content was easy. And because the sessions have been pre-recorded, the speakers for each se... » read more

Why Safety-Critical Verification Is So Difficult
By Ann Mutschler - 15 Jul, 2020 - Comments: 0

The inclusion of AI chips in automotive and increasingly in avionics has put a spotlight on advanced-node designs that can meet all of the ASIL-D requirements for temperature and stress. How should designers approach this task, particularly when these devices need to last longer than the applications? Semiconductor Engineering sat down to discuss these issues with Kurt Shuler, vice president of... » read more

Power Impact At The Physical Layer Causes Downstream Effects
By Ann Mutschler - 09 Jul, 2020 - Comments: 0

Data movement is rapidly emerging as one of the top design challenges, and it is being complicated by new chip architectures and physical effects caused by increasing density at advanced nodes and in multi-chip systems. Until the introduction of the latest revs of high-bandwidth memory, as well as GDDR6, memory was considered the next big bottleneck. But other compute bottlenecks have been e... » read more

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