Anne Meixner

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Anne Meixner is a contributing editor at Semiconductor Engineering. She has 30+ years in the semiconductor industry. She became fascinated by defects in the semiconductor manufacturing process as a young engineer at IBM. Over that period, she has focused on test methodology with emphasis on mixed-signal and analog DFT and test. As a technical communicator she takes complex ideas and explains them in consumable understandable pieces. Meixner has worked at IBM, Carnegie Mellon University and Intel. She holds three U.S. patents and her peers have recognized her work with two best papers at IEEE International Test Conference. She founded The Engineers’ Daughter in 2015 to consult on semiconductor testing and to coach engineers.

Author's Latest Posts

Using Fab Sensors To Reduce Auto Defects

By Anne Meixner - 09 Jun, 2020 - Comments: 0

The semiconductor manufacturing ecosystem has begun collaborating on ways to effectively use wafer data to meet the stringent quality and reliability requirements for automotive ICs. Silicon manufacturing companies are now leveraging equipment and inspection monitors to proactively identify impactful defects prior to electrical test. Using machine learning techniques, they combine the monitor ... » read more

Sensing Automotive IC Failures

By Anne Meixner - 12 May, 2020 - Comments: 1

The sooner you detect a failure in any electronic system, the sooner you can act. Together, data analytics and on-chip sensors are poised to boost quality in auto chips and add a growing level of predictive maintenance for vehicles. The ballooning number of chips cars makes it difficult to reach 10 defective parts per billion for every IC that goes into a car. And requiring that for a 15-y... » read more

The Need For Traceability In Auto Chips

By Anne Meixner - 07 Apr, 2020 - Comments: 4

Someday your car will drive itself to a repair shop for a recall using a scheduling application that is both efficient and can prioritize which vehicles need to be fixed first. But that's still a ways off. Proactive identification of issues is not yet available. To be ready for that, today’s data analytics systems need to begin supporting targeted recalls, enabling predictive maintenance a... » read more

More Data, More Problems In Automotive

By Anne Meixner - 11 Feb, 2020 - Comments: 0

The race toward increasing levels of autonomy is being hampered by competitive concerns over sharing data across the automotive supply chain. Pushing past the initial ADAS levels into full autonomy is expected to take more than a decade, but the infrastructure for those systems, and making sure all assisted and autonomous vehicles work with other vehicles, is under development today. Still, ... » read more

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