Device Validation: The Ultimate Test Frontier

By Dave Armstrong - 11 Apr, 2023 - Comments: 0

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original article at https://chipscalereview.com/wp-content/uploads/flipbook/30/book.html, p. 26. In the early days of space exploration, spacecraft were manned by small teams of astronauts, most of whom were experienced test pilots who ... » read more

HSIO Loopback Turns Challenges Into Opportunities For Test At 112 Gbps

By Dave Armstrong - 07 Dec, 2021 - Comments: 0

By Dave Armstrong and Don Thompson For both PCIe and Ethernet (IEEE 802.3,) signals are getting mighty small. With PCIe 5 reaching 32 Gbps (NRZ at 32 GBaud) and 802.3 reaching 112 Gbps (PAM4 at 56 GBaud), typical eye-mask limits are shrinking. Consequently, test requirements for high-speed I/O (HSIO) test are becoming daunting. HSIO test involves measurement of Tx eye height and width, co... » read more

SLT Enables Test Content To Shift Right

By Dave Armstrong - 10 Aug, 2021 - Comments: 0

By Dave Armstrong, Davette Berry, and Craig Snyder Increasing device complexity and the continuing drive for higher levels of quality are fostering a reconsideration of test strategies. To be effective, test engineers must choose how to optimally deploy test content, from wafer probing to system-level test (SLT). A March 2019 TestConX presentation1 outlines how test content is typically allo... » read more